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Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy

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Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Part of the book series: Lecture Notes in Physics ((LNP,volume 588))

Abstract

A SNOM apparatus working at liquid-He temperatures has been realized and characterized. Standard optical facilities allow for a combined spatial and spectral analysis of the photoluminescence emissions in semiconductors. A novel distance control system is used. The sensitivity in the approach direction is 0.2 nm, and quality factors up to 2850 have been obtained. No electronic components are needed close to the sensor, allowing to employ it in a liquid He environment. The system is extremely compact and allows for several hours stability at 5 K.

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Author information

Authors and Affiliations

  1. Physics Department, Swiss Federal Institute of Technology Lausanne, CH-1015, Lausanne-EPFL, Switzerland

    A. Crottini, J. L. Staehli & B. Deveaud

  2. Electrotechnical Laboratory, 1-1-4 Umezono, 305-8568, Tsukuba, Ibaraki, Japan

    X. L. Wang & M. Ogura

Authors
  1. A. Crottini
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  2. J. L. Staehli
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  3. B. Deveaud
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  4. X. L. Wang
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  5. M. Ogura
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Editor information

Editors and Affiliations

  1. NTT Basic Research Laboratories, 3-1,Morinosato Wakamiya, 243-0198, Atsugi-shi Kanagawa, Japan

    Yoshio Watanabe

  2. Istituto MASPEC, Parco Area delle Science 37/A, 43010, Parma, Italy

    Giancarlo Salviati

  3. Sincrotrone Trieste, AREA Science Park Strada Statale 14, Km 163,5, 34012, Trieste, Basovizza, Italy

    Stefan Heun

  4. Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, 152-8551, Tokyo, Japan

    Naoki Yamamoto

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© 2002 Springer-Verlag Berlin Heidelberg

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Crottini, A., Staehli, J.L., Deveaud, B., Wang, X.L., Ogura, M. (2002). Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy. In: Watanabe, Y., Salviati, G., Heun, S., Yamamoto, N. (eds) Nanoscale Spectroscopy and Its Applications to Semiconductor Research. Lecture Notes in Physics, vol 588. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45850-6_18

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  • DOI: https://doi.org/10.1007/3-540-45850-6_18

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-43312-5

  • Online ISBN: 978-3-540-45850-0

  • eBook Packages: Springer Book Archive

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