Advertisement

X-ray Photoemission and Low-Energy Electron Microscope

  • R. Vašina
  • M. Mynář
  • V. Kolařík
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 588)

Abstract

A small state-of-the-art X-ray photoemission and and low energy microscope with electron mirror corrector has been developed. The paper describes requirements, design aspects and status of the microscope.

Keywords

Chromatic Aberration LEED Pattern Illumination Beam Beam Separator Adsorbate Island 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    L. H. Veneklasen: Rev. Sci. Instrum. 12, 63 (1992), pp. 5513–5531CrossRefGoogle Scholar
  2. 2.
    P. Adamec, E. Bauer and B. Lencová: Rev. Sci. Instrum. 10 69 (1998), pp. 3538–3587Google Scholar
  3. 3.
    D. Preikszas: Korrektur des Farb-und Öffnungsfehlers eines Niederspannungs-Elektronenmikroskops mit Hilfe eines Elektronspiegels (Darmstadt 1995)Google Scholar
  4. 4.
    R. Fink et al: Surface Review and Letters 6 5 (1998), pp. 1249–1256Google Scholar
  5. 5.
    E. Bauer: Surface Review and Letters 6 5 (1998), pp. 1275–1286CrossRefGoogle Scholar
  6. 6.
    Y. Sakai, M. Kato, B. Achard, T. Ichinokawa, S. Masuda and Y. Harada: ‘Development of LEEM and MEM’. In: Proc. of 13th ICEM, France, July 17–22, 1994, ed. by B. Jouffrey, C. Colliex, pp. 773–774Google Scholar
  7. 7.
    M. Maňkoš, V. Kolařík, L. H. Veneklasen: Nucl. Instr. and Meth. 1–3 A298 (1990), pp. 189–198Google Scholar
  8. 9.
    H. Rose, D. Preikszas and R. Degenhardt: Patent No. EP 0530640B1, European Patent Office, 1996Google Scholar
  9. 10.
    R.M. Tromp, M. Mankos, M.C. Reuter, A. W. Ellis and M. Copel: Surface Review and Letters 6 5 (1998), pp. 1189–1197CrossRefGoogle Scholar
  10. 11.
    J. Vašina and R. Vašina: ‘COM technology based modular software for scientific instrumentation controle’. In: Proc. of 12th EUREM, Brno, Czech Rep., 2000, pp. I417–I418Google Scholar
  11. 13.
    P. W. Hawkes, E. Kasper: Principles of Electron Optics (Academic Press, London 1996)Google Scholar
  12. 14.
    W. H. Press, S. A. Teukolsky, W. T. Wetterlink, B. P. Flannery: Numerical Recipes in C: the art of scientific computing (Cambridge University Press, Cambridge 1994)Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • R. Vašina
    • 1
  • M. Mynář
    • 1
  • V. Kolařík
    • 1
  1. 1.Delong InstrumentsBrnoCzech Republic

Personalised recommendations