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Photoelectron Spectroscopy with a Photoemission Electron Microscope

  • S. Heun
  • Y. Watanabe
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 588)

Abstract

This article reviews laterally resolved x-ray photoemission spectroscopy (XPS) with a direct imaging photoemission electron microscope (PEEM). Applications of photoelectron spectroscopy with a sophisticated PEEM, a spectroscopic photoemission and low energy electron microscope (SPELEEM), are also given. The results of SPELEEM measurements from self-organized InAs nanocrystals are compared to conventional photoelectron spectral analyses. This comparison demonstrates that photoelectron spectroscopy with the SPELEEM is a reliable way to obtain information on the electronic structure of a sample from a sub-100 nm-sized area.

Keywords

GaAs Substrate Core Level Lateral Resolution Electron Energy Loss Spectroscopy Core Level Spectrum 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer-Verlag Berlin Heidelberg 2002

Authors and Affiliations

  • S. Heun
    • 1
  • Y. Watanabe
    • 2
  1. 1.Sincrotrone TriesteTriesteItaly
  2. 2.NTT Basic Research LaboratoriesKanagawaJapan

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