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Photoelectron Spectroscopy with a Photoemission Electron Microscope

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Nanoscale Spectroscopy and Its Applications to Semiconductor Research

Part of the book series: Lecture Notes in Physics ((LNP,volume 588))

Abstract

This article reviews laterally resolved x-ray photoemission spectroscopy (XPS) with a direct imaging photoemission electron microscope (PEEM). Applications of photoelectron spectroscopy with a sophisticated PEEM, a spectroscopic photoemission and low energy electron microscope (SPELEEM), are also given. The results of SPELEEM measurements from self-organized InAs nanocrystals are compared to conventional photoelectron spectral analyses. This comparison demonstrates that photoelectron spectroscopy with the SPELEEM is a reliable way to obtain information on the electronic structure of a sample from a sub-100 nm-sized area.

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Author information

Authors and Affiliations

  1. Sincrotrone Trieste, Basovizza, 34012, Trieste, Italy

    S. Heun

  2. NTT Basic Research Laboratories, Atsugi, 243-0198, Kanagawa, Japan

    Y. Watanabe

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  1. S. Heun
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  2. Y. Watanabe
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Editor information

Editors and Affiliations

  1. NTT Basic Research Laboratories, 3-1,Morinosato Wakamiya, 243-0198, Atsugi-shi Kanagawa, Japan

    Yoshio Watanabe

  2. Istituto MASPEC, Parco Area delle Science 37/A, 43010, Parma, Italy

    Giancarlo Salviati

  3. Sincrotrone Trieste, AREA Science Park Strada Statale 14, Km 163,5, 34012, Trieste, Basovizza, Italy

    Stefan Heun

  4. Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, 152-8551, Tokyo, Japan

    Naoki Yamamoto

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© 2002 Springer-Verlag Berlin Heidelberg

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Heun, S., Watanabe, Y. (2002). Photoelectron Spectroscopy with a Photoemission Electron Microscope. In: Watanabe, Y., Salviati, G., Heun, S., Yamamoto, N. (eds) Nanoscale Spectroscopy and Its Applications to Semiconductor Research. Lecture Notes in Physics, vol 588. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45850-6_14

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  • DOI: https://doi.org/10.1007/3-540-45850-6_14

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