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Capacitance, Charge Fluctuations and Dephasing in Coulomb Coupled Conductors

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Interacting Electrons in Nanostructures

Part of the book series: Lecture Notes in Physics ((LNP,volume 579))

Abstract

The charge fluctuations of two nearby mesoscopic conductors coupled only via the long range Coulomb force are discussed and used to find the dephasing rate which one conductor exerts on the other. The discussion is based on a formulation of the scattering approach for charge densities and the density response to a fluctuating potential. Coupling to the Poisson equation results in an electrically self-consistent description of charge fluctuations. At equilibrium the low-frequency noise power can be expressed with the help of a charge relaxation resistance (which together with the capacitance determines the RC-time of the structure). In the presence of transport the low frequency charge noise power is determined by a resistance which reflects the presence of shot noise. We use these results to derive expressions for the dephasing rates of Coulomb coupled conductors and to find a self-consistent expression for the measurement time.

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Author information

Authors and Affiliations

  1. Département de Physique Théorique, Université de Genève, CH-1211, Genève 4, Switzerland

    Markus Büttiker

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  1. Markus Büttiker
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Editor information

Editors and Affiliations

  1. Abteilung Nanostrukturen Institut für Festkörperphysik, Universität Hannover, Appelstr.2, 30167, Hannover, Germany

    Rolf Haug

  2. Institut für Theoretische Physik Lehrstuhl A, RTWH Aachen, 52056, Aachen, Germany

    Herbert Schoeller

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© 2001 Springer-Verlag Berlin Heidelberg

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Büttiker, M. (2001). Capacitance, Charge Fluctuations and Dephasing in Coulomb Coupled Conductors. In: Haug, R., Schoeller, H. (eds) Interacting Electrons in Nanostructures. Lecture Notes in Physics, vol 579. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45532-9_8

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  • DOI: https://doi.org/10.1007/3-540-45532-9_8

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-42222-8

  • Online ISBN: 978-3-540-45532-5

  • eBook Packages: Springer Book Archive

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