Phonon Fine Structure in the 1/f Noise of Metals, Semiconductors and Semiconductor Devices

  • Mihai N. Mihaila
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 550)


Results pointing to phonon participation in the 1/f noise of metals, semiconductors and semiconductor devices are presented. Afine structure corresponding to both bulk and surface phonons is shown to exist in the 1/f noise of different solid-state physical systems. It is described how Phonon Density Of States (PDOS) superposition method can be used to identify surface and bulk equilibrium atomic motions as microscopic 1/f noise sources. Aclose connection between the 1/f noise parameter and PDOS or Eliashberg function is suggested. Examples proving that the temperature dependence of the 1/f noise parameter is the image of the lattice vibration spectrum are given for both metals and semiconductors. Consequently, a simple connection between the activation energy distribution and PDOS is revealed and lattice anharmonicity appears to naturally affect the frequency exponent.


Noise Intensity Gallium Arsenide Noise Data Noise Parameter Inelastic Neutron Scattering 
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  1. 1.
    Johnson, J. B. (1928) Thermal agitation of electricity in conductors. Phys. Rev. 32: 97–113CrossRefADSGoogle Scholar
  2. 2.
    Schottky, W. (1926) Small shot effect and flicker effect. Phys. Rev. 28: 74–103CrossRefADSGoogle Scholar
  3. 3.
    van der Ziel, A. (1970) Noise in solid-state devices and lasers. Proc. IEEE 58: 1178–1206Google Scholar
  4. 4.
    Hooge, F. N. (1976) 1/f noise. Physica 83B: 14–23Google Scholar
  5. 5.
    van der Ziel, A. (1979) Flicker noise in electronic devices. Adv. in Electron. and Electron Phys., L. Marton and C. Marton(editors), Academic Press, 49:225–297Google Scholar
  6. 6.
    Dutta, P., Horn, P. M. (1981) Low-frequency fluctuations in solids: 1/f noise. Rev. Mod. Phys. 53: 497–516CrossRefADSGoogle Scholar
  7. 7.
    Hooge, F. N., Kleinpenning, T. G. M., Vandamme, L. K. J. (1981) Experimental studies on 1/f noise. Rep. Prog. Phys. 44: 479–532CrossRefADSGoogle Scholar
  8. 8.
    Kogan, Sh. M. (1985) Curent noise with 1/f type spectra in solid. Sov. Phys.-Usp. 28: 285–328CrossRefGoogle Scholar
  9. 9.
    van der Ziel, A. (1988) Unified presentation of 1/f noise in electronic devices: fundamental 1/f noise sources. Proc. IEEE 76: 233–258Google Scholar
  10. 10.
    Weissman, M. B. (1988) 1/f noise and other slow, nonexponential kinetics in condensed matter. Rev. Mod. Phys. 60: 537–571CrossRefADSGoogle Scholar
  11. 11.
    Giordano, N. (1989) Defect motion and low frequency noise in disordered metals. Reviews of Solid State Science 3: 27–69Google Scholar
  12. 12.
    van Vliet, Carolyn M. (1991) Asurvey of results and future prospects on quantum 1/f noise and 1/f noise in general. Solid-St. Electron. 34: 1–21CrossRefADSGoogle Scholar
  13. 13.
    Dyakonova, N. V., Levinstein, M. E., Rumyantsev. S. L. (1991) Nature of the bulk 1/f noise in GaAs and Si(review). Sov. Phys. Semicond. 25:1241–1265Google Scholar
  14. 15.
    Jones, B. K. (1997) Electrical noise in semiconductors: the role of phonons. Unsolved Problems of Noise, Ch. Doering, L. B. Kiss, M. Shlesinger(editors), World Scientific, 27–38Google Scholar
  15. 16.
    Weissman, M. B. (1997) Some unsolved problems in 1/f conductance noise. Unsolved Problems of Noise, Ch. Doering, L. B. Kiss, M. Shlesinger(editors), World Scientific, 39–56Google Scholar
  16. 17.
    Voss, Richard F., Clarke, John (1976) 1/f noise from systems in thermal equilibrium. Phys. Rev. Lett. 36: 42–45CrossRefADSGoogle Scholar
  17. 18.
    Beck, H. G. E., Spruit, W. P. 1/f noise in the variance of Johnson noise. J. Appl. Phys. 49: 3384–3386Google Scholar
  18. 19.
    Hooge, F. N., Vandamme, L. K. J. (1978) Lattice scattering causes 1/f noise. Phys. Lett. 66A:315–316ADSGoogle Scholar
  19. 20.
    Palenskis, V., Z. Shoblitskas, Z. (1982) Origin of 1/f noise. Solid St. Comm. 43:761–763CrossRefADSGoogle Scholar
  20. 21.
    Mihaila, M. (1984) Phonon observations from 1/f noise measurements. Phys. Lett. 104A:157–158ADSGoogle Scholar
  21. 22.
    Akimenko, A. I., Verkin, A. B., Yanson, I. K. (1984) Point contact noise spectroscopy of phonons in metals. J. Low Temp. Phys. 54: 247–266CrossRefADSGoogle Scholar
  22. 23.
    Mihaila, M. (1985) Phonon signature in the 1/f noise parameter of copper, silver and silicon. Phys. Lett. 107A: 465–467ADSGoogle Scholar
  23. 24.
    Planat, M., Gagnepain, J. J. (1987) 1/f noise in quartz crystal resonators in relation with acoustic losses and frequency dispersion. Appl. Phys. Lett. 50: 510–512CrossRefADSGoogle Scholar
  24. 25.
    Musha, T., Borbely, G., Shogi, M. (1990) 1/f phonon-number fluctuations in quartz observed by laser light scattering. Phys. Rev. Lett. 64:2394–2397CrossRefGoogle Scholar
  25. 26.
    Koslowski, B., Baur, C. et al. (1993) Atomic scale variation of current noise in GaAs(110) detected by a scanning tunneling microscope. Surf. Science 280:106–114CrossRefADSGoogle Scholar
  26. 27.
    J. Bernamont (1937) Fluctuations de potentiel aux bornes d’un conducteur metallique de faible volume parcouru par un courant. Ann. Phys.(Leipzig)7:71–140Google Scholar
  27. 28.
    van der Ziel, A. (1950) On the noise spectra of semi-conductor noise and of flicker effect. Physica XVI:359–372Google Scholar
  28. 29.
    du Pre, F. K. (1950) Asuggestion regarding the spectral density of flicker noise. Phys. Rev. 78: 615CrossRefADSGoogle Scholar
  29. 30.
    McWhorter, A. L. (1957) 1/f noise and germanium surface properties. Semiconductor Surface Physics, R. H. Kingston(editor), 207–228Google Scholar
  30. 31.
    Hooge, F. N. (1969) 1/f noise is no surface efect. Phys. Lett. 29A:139–140ADSGoogle Scholar
  31. 32.
    Kleinpenning, T. G. M. (1974) 1/f noise in thermo e.m.f of intrinsic and extrinsic semiconductors. Physica 77:78–98CrossRefADSGoogle Scholar
  32. 33.
    Schmidt, R. R., Bosman, G. et al. (1983) Noise in near-ballistic n+nn+ and n+pn+ gallium arsenide submicron diodes. Solid-St. Electron. 26:437–444CrossRefADSGoogle Scholar
  33. 34.
    Carruthers, Tom (1971) Bias-dependent structure in excess noise in GaAs Schottky tunnel junctions. Appl. Phys. Lett. 18: 35–37CrossRefADSGoogle Scholar
  34. 35.
    Mihaila, M. (1986) Lattice vibrations in silicon by 1/f noise spectroscopy. Noise in Phys. Syst. and 1/f Noise, Elsevier Science, A. D’Amico and P. Mazzetti (editors), 433–435Google Scholar
  35. 36.
    Mihaila, M. (1987) A possible fundamental property of the 1/f noise in condenced matter systems. Noise in Phys. Syst. and 1/f Noise, World Scientific, C.M. van Vliet (editor), 343–346Google Scholar
  36. 37.
    Mihaila, M., Heedt, C., Tegude, F. J. (1996) Nonlinear effects in the 1/f noise of lattice-matched InAlAs/InGaAs HEMT’s. AIP Conf. Proc. 371, P. H. Handel, A. L Chung (editors), 127–133Google Scholar
  37. 38.
    Mihaila, M., Heedt, C. et al. (1996) Origin of 1/f noise in InAlAs/InGaAs HEMT’s. Proc. IPRM, 368–371Google Scholar
  38. 39.
    Mihaila, M., Mihaila, A.-P. (1997) 1/f noise phonon spectroscopy in In-AlAs/InGaAs HEMT’s. Noise in Phys. Syst. anf 1/f Noise, World Scientific, C. Claeys and E. Simoen(editors), 51–54Google Scholar
  39. 40.
    Eberhard, J. W., and Horn, P. M., (1978) Excess (1/f) noise in metals. Phys. Rev. 18B: 6681–6693ADSGoogle Scholar
  40. 41.
    Kilmer, J., van Vliet, C. M. et al. (1984) Evidence of electromagnetic quantum 1/f noise found in gold thin films. Phys. Stat. Sol. 121b: 429–432ADSGoogle Scholar
  41. 42.
    Fleetwood, D. M., Beutler, D. E. et al. (1987) The role of temperature in sample-to-sample comparisons of the 1/f noise of metal films J. Appl. Phys. 61: 5308–5313CrossRefADSGoogle Scholar
  42. 43.
    Giordano, N. (1996-II) Low-frequency electrical noise in Ni: The effects of magnetic fluctuations. Phys. Rev. 53B: 14937–14940ADSGoogle Scholar
  43. 44.
    Fleetwood, D. M., Giordano, N. (1985) Direct link between 1/f noise and defects in metal fields. Phys. Rev. 31B:115–7–1160ADSGoogle Scholar
  44. 45.
    Scofield, J. H., Mantese J., Webb, W. W. (1986) Temperature dependence of 1/f noise processes in metals. Phys. Rev. 34B: 723–731ADSGoogle Scholar
  45. 46.
    Zimmerman, N. M. and Webb, W. W. (1988) Microscopic scatterer displacements generate the 1/f resistance noise of H in Pd. Phys. Rev. Lett. 61: 889–892CrossRefADSGoogle Scholar
  46. 47.
    Keener, C. D., Weissman, M. B. (1991-I) 1/f noise in bismuth consistent with defect motion. Phys. Rev. 44B: 9178–9184ADSGoogle Scholar
  47. 48.
    Ralls, K. S, Buhrman, R. A. (1991-I) Microscopic study of 1/f noise in metal nanobridges. Phys. Rev. 44B:5800–5817ADSGoogle Scholar
  48. 49.
    Koch, R. H., Lloyd, J. R., and Cronin, J. (1985) 1/f noise and grain-boundary diffusion in aluminum alloys. Phys. Rev. Lett. 55: 2487–2490CrossRefADSGoogle Scholar
  49. 50.
    Briggmann, J., Dagge, K. et al. (1994) Irradiation-induced defects in thin aluminium films studied be 1/f noise. Phys. Stat. Sol.(a) 146:325–335CrossRefADSGoogle Scholar
  50. 51.
    Van den Homberg, M. J. C., Verbruggen, A. H. et al. (1998) 1/f noise in mono-and polycrystalline aluminum. Phys. Rev. 57B: 53–55ADSGoogle Scholar
  51. 52.
    Mihaila, M. (1986) Phononic structures in the 1/f noise parameter of the gold films. Noise in Phys. Syst. and 1/f Noise, A. D’Amico and P. Mazzetti(editors), Elsevier, 437–439Google Scholar
  52. 53.
    Mihaila, M., Stepanescu, A., and Masoero, A. (1991) Phonon fingerprints in the 1/f noise of discontinuous platinum films. Noise in Phys. Syst. and 1/f Noise, T. Musha, S. Sato and M. Yamamoto(editors), Ohmsha Ltd., 17–22Google Scholar
  53. 54.
    Mihaila, M., Stepanescu, A., Masoero, A. (1995) Longitudinal motion of surface atoms generates 1/f noise in discontinuous platinum films. Noise in Phys. Syst. and 1/f Fluctuations, V. Bareikis and R. Katilius (editors), World Scientific, 307–310Google Scholar
  54. 55.
    Mihaila, M., Mihaila, A.-P. (1997) Enhanced 1/f noise induced by atomic Rayleigh waves in discontinuous platinum films. Unsolved Problems of Noise, Ch. Doering, L. B. Kiss, M. F. Shlesinger(editors), World Scientific, 81–86Google Scholar
  55. 56.
    Verbruggen, A. H., Koch, R. H., and Umbach, C. P. (1987-I) Correlations between 1/f noise and grain boundaries in thin gold films. Phys. Rev. 35B:5864–5867ADSGoogle Scholar
  56. 57.
    Ochs, E., Seeger., A. et al. (1998) Electrical noise in nanocrystalline films. Phys. Stat. Sol.(rapid research note)Google Scholar
  57. 58.
    Dutton, D. H., Brockhouse, B. N., Miiller, A. P. (1972) Crystal dynamics of platinum by inelastic neutron scattering. Can. J. Phys. 50: 2915–2927ADSGoogle Scholar
  58. 59.
    Kern, Klaus, David, Rudolf et al. (1986) Surface phonon dispersion of platinum (111). Phys. Rev. B33: 4334–4337ADSGoogle Scholar
  59. 60.
    Mihaila, M. (1999) Possible connection between 1/f noise parameter and the Eliashberg function, van der Ziel Symposium on Quantum 1/f Noise, P. H. Handel and A.L. Chung(editor), AIP Press, 466:48–54Google Scholar
  60. 61.
    Rowell, J. M., McMillan, W. L., Feldmann, W. L. (1971) Superconductivity and lattice dynamics of white tin. Phys. Rev. 3B: 4065–4073ADSGoogle Scholar
  61. 62.
    Clarke, J., Hsiang, T. Y. (1976) Low-frequency noise in tin and lead films at the superconducting transition. Phys. Rev. 13B: 4790–4800ADSGoogle Scholar
  62. 63.
    Fleetwood, D. M. and Giordano, N. (1982) Experimental study of excess lowfrequency noise in tin. Phys. Rev. 25B:1427–1430ADSGoogle Scholar
  63. 64.
    Montgomery, H. C. (1952) Electrical noise in semiconductors. Bell System Tech. J. 31:950–975Google Scholar
  64. 65.
    Black, R. D., Restle, P. J., Weissman, M. B. (1983) Hall effect, anisotropy, and temperature-dependence measurements of 1/f noise in silicon on sapphire. Phys. Rev. 28B:1935–1943ADSGoogle Scholar
  65. 66.
    Bisschop, J., Cuijpers, J. L. (1983) Experimental temperature dependence of 1/f fluctuations in germanium and silicon. Physica B123: 6–10Google Scholar
  66. 67.
    Chen, X. Y. (1997) Temperature dependence of 1/f noise. Unsolved Problems of Noise, Ch. Doering, L. B. Kiss, M. F. Shlesinger(editors), World Scientific, 111–116Google Scholar
  67. 68.
    Chen, X. Y., Koenraad, P. M. et al. (1997-II) 1/f noise in d-doped GaAs analyzed in terms of mobility fluctuations. Phys. Rev. B55: 5290–5296; Chen, X. Y. (1997) Ph. D. Thesis, Eindhoven Univ. of TechnologyADSGoogle Scholar
  68. 69.
    Dolling, G., Cowley, R. A. (1966) The thermodynamic and optical properties of germanium, silicon, diamond and gallium arsenide. Proc. Phys. Soc., London 88:463–494Google Scholar
  69. 70.
    Dutta, P, Dimon, P., Horn, P. M. (1979) Energy scales for noise processes in metals. Phys. Rev. Lett. 43:646–649CrossRefADSGoogle Scholar
  70. 71.
    Mihaila, M. (1999) Image of lattice vibration spectrum in the 1/f noise of semiconductors. 15th Int. Conf. on Noise in Phys. Syst. and 1/f Fluctuations (Hong Kong),Ch. Surya (editor), Bentham Press, 146–149Google Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2000

Authors and Affiliations

  • Mihai N. Mihaila
    • 1
  1. 1.Institute of MicrotechnologyBucharestRomania

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