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Phase Noise Metrology

  • Enrico Rubiola
  • Vincent Giordano
Conference paper
Part of the Lecture Notes in Physics book series (LNP, volume 550)

Abstract

As a result of a major technological trend towards high speed digital communications and circuits, phase noise turns out to be a relevant concern for scientists and engineers. This paper describes methods and instruments to measure the phase noise of oscillators, components and more complex devices in the radiofrequency and microwave bands, from approximately 100 kHz to 30-40 GHz, and even beyond. After a brief introduction, two sections deal with basic definitions and traditional methods, and one section presents a set of schemes that cover most actual needs. Then a new approach— known as the interferometric method— is discussed in detail, providing design strategies and examples; this method exhibits the highest sensitivity in real time, which can alse be exploited to dynamically correct the phase noise of amplifiers and oscillators. The last section deals with an improved version of the interferometric method, in which correlation is used to remove the instrument noise of two equal interferometers that simultaneously measure the same device. This scheme enables the measurement of low noise processes, even below the thermal floor, and therefore it represents the state of the art in the high sensitivity phase noise metrology.

Keywords

Phase Noise Thermal Noise Power Spectrum Density Phase Lock Loop Instrument Noise 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    D. B. Leeson, “Asimple model of feed back oscillator noise spectrum”, IEEE Proceedings vol. 54 no. 2 pp. 329–330, February 1966.Google Scholar
  2. 2.
    D. B. Leeson, G. F. Johnson, “Short-term stability for a Doppler radar: requirements, measurements and techniques”, Proc. IEEE-NASA Symposium on Short Term Frequency Stability pp. 3–9, Greenbelt (MD, USA), 23–24 November 1964.Google Scholar
  3. 3.
    S. J. Goldman, Phase noise analysis in radar systems, John Wiley 1989, ISBN 0-471-61894-2.Google Scholar
  4. 4.
    E. S. Ferre-Pickal, J. R. Vig, J. C. Camparo, L. S. Cutler, L. Maleki, W. J. Riley, S. R. Stein, C. Thomas, F. L. Walls and J. D. White, “Draft revision of IEEE STD 1139-1988 standard definitions of physical quantities for fundamental frequency and time metrology—random instabilities”, Proc. 51st Frequency Control Symposium pp. 338–357, Orlando (FL, USA), 28–30 May 1997.Google Scholar
  5. 5.
    S. A. Maas, Microwave mixers, Artech House 1993, ISBN 0-89006-605-1.Google Scholar
  6. 6.
    S. A. Maas, Nonlinear Microwave Circuits, Artech House 1998, ISBN 0-7803-3403-5.Google Scholar
  7. 7.
    E. L. Kollberg (editor), Microwave and millimeter-wave Mixers, IEEE Press 1984, ISBN 0-87942-179-7Google Scholar
  8. 8.
    S. Franco, Design with operational amplifiers and analog integrated circuits (2nd ed), McGraw Hill 1998, ISBN 0-07-115722-0.Google Scholar
  9. 9.
    V. N. Kuleshov, T. I. Boldyreva, “1/f AM and PM noise in bipolar transistor amplifiers: sources, ways of infiuence, techniques of reduction”, Proc. 51st Frequency Control Symposium pp. 446–455, Orlando (FL, USA), 28–30 May 1997.Google Scholar
  10. 10.
    F. L. Walls, E. S. Ferre-Pikal, S. R. Jefferts, “Origin of 1/f PM and AM noise in bipolar junction transistor amplifiers”, IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control vol. 44 no. 2 pp. 326–334, March 1997.CrossRefGoogle Scholar
  11. 11.
    J. J. Gagnepain, “Fundamental noise studies of quartz crystal resonators”, Proc. 30th Frequency Control Symposium pp. 84–91, Atlantic City (USA), 2–4 Jun 1976.Google Scholar
  12. 12.
    K. H. Sann, “The measurement of near-carrier noise in microwave amplifiers”, IEEE Transactions on Microwave Theory and Techniques vol. 16 no. 9 pp. 761–766, September 1968.CrossRefADSGoogle Scholar
  13. 13.
    E. Rubiola, V. Giordano, J. Groslambert, “Very high frequency and microwave interferometric PM and AM noise measurements”, Review of Scientific Instruments vol. 70 no. 1 pp. 220–225, January 1999. ISSN 0034-6748.CrossRefADSGoogle Scholar
  14. 14.
    R. Mongia, I. J. Bahl, P. Bhartia, RF and microwave coupled-line circuits, Artech House 1999, ISBN 0-89006-830-5.Google Scholar
  15. 15.
    J. Groslambert, V. Giordano, M. Brunet, E. Rubiola, “Flicker noise measurement of HF quartz resonators”, Proc. 13th European Frequency and Time Forum / 1999 Frequency Control Symposium, Besançon (France), 12–16 April 1999. To be printed.Google Scholar
  16. 16.
    E. Rubiola, J. Groslambert, M. Brunet, V. Giordano, “Flicker noise measurement of HF quartz resonators”, to be published in the IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 2000.Google Scholar
  17. 17.
    E. N. Ivanov, M. E. Tobar, R. A. Woode, “Microwave interferometry: applications to precision measurements and noise reduction techniques”, IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control vol. 45 no. 6 pp. 1526–1536, November 1998.CrossRefGoogle Scholar
  18. 18.
    R. F. C. Vessot, R. F. Mueller, J. Vanier, “Across-correlation technique for measuring the short-term properties of stable oscillators”, Proc. IEEE-NASA Symposium on Short Term Frequency Stability pp. 111–118, Greenbelt (MD, USA), 23–24 November 1964.Google Scholar
  19. 19.
    F. L. Walls, S. R. Stain, J. E. Gray, D. J. Glaze, “Design considerations in state of-the-art signal processing and phase noise measurement systems”, Proc. 30th Frequency Control Symposium pp. 269–274, Atlantic City (NJ, USA) 2–4 Jun 1976.Google Scholar
  20. 20.
    D. Fest, J. Groslambert, J. J. Gagnepain, “Individual characterization of an oscillator by means of cross-correlation or cross covariance method”, IEEE Transactions on Instrumentation and Measurement vol. 32 no. 3 pp. 447–450, September 1983.CrossRefGoogle Scholar
  21. 21.
    R. N. McDonough, A. D. Whalen, Detection of signals in noise, Academic Press 1995, ISBN 0-12-744852-7.Google Scholar
  22. 22.
    E. Rubiola, V. Giordano, and J. Groslambert, “Double correlating interferometer scheme to measure PM and AM noise”, Electronics Letters vol. 34 no. 1, January 8th, 1998.Google Scholar
  23. 23.
    E. Rubiola, V. Giordano, “Correlation-based noise measurements below the thermal noise floor”, Proc. 13th European Frequency and Time Forum / 1999 Frequency Control Symposium, Besançon (France), 12–16 April 1999. To be printed.Google Scholar
  24. 24.
    E. Rubiola, V. Giordano, J. Groslambert, “Improved interferometric method to measure near-carrier AM and PM noise”, IEEE Transactions on Instrumentation and Measurement vol. 48 no. 2 pp. 642–646, April 1999.CrossRefGoogle Scholar

Copyright information

© Springer-Verlag Berlin Heidelberg 2000

Authors and Affiliations

  • Enrico Rubiola
    • 1
    • 2
  • Vincent Giordano
    • 2
  1. 1.Dipartimento di Elettronica, and INFM UDR PolitecnicoPolitecnico di TorinoTorinoItaly
  2. 2.LPMOUPR-3203 du CNRS associée à l’Université de Franche-ComtéBesançonFrance

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