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Using Test Plans for Bayesian Modeling

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Machine Learning and Data Mining in Pattern Recognition (MLDM 2003)

Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 2734))

Abstract

When modeling technical processes, the training data regularly come from test plans, to reduce the number of experiments and to save time and costs. On the other hand, this leads to unobserved combinations of the input variables. In this article it is shown, that these unobserved configurations might lead to un-trainable parameters. Afterwards a possible design criterion is introduced, which avoids this drawback. Our approach is tested to model a welding process. The results show, that hybrid Bayesian networks are able to deal with yet unobserved in- and output data.

This work was funded by the “German Research Association” (DFG), Collaborative research center (SFB) 396, project-parts C1 and C3. Only the authors are responsible for the content of this article.

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© 2003 Springer-Verlag Berlin Heidelberg

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Deventer, R., Denzler, J., Niemann, H., Kreis, O. (2003). Using Test Plans for Bayesian Modeling. In: Perner, P., Rosenfeld, A. (eds) Machine Learning and Data Mining in Pattern Recognition. MLDM 2003. Lecture Notes in Computer Science, vol 2734. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-45065-3_27

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  • DOI: https://doi.org/10.1007/3-540-45065-3_27

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-40504-7

  • Online ISBN: 978-3-540-45065-8

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