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The NIST HumanID Evaluation Framework

  • Ross J. Micheals
  • Patrick Grother
  • P. Jonathon Phillips
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2688)

Abstract

The NIST HumanID Evaluation Framework, or HEF, is an effort to design, implement, and deploy standards for the robust and complete documentation of the biometric system evaluation process. The HEF leverages contemporary technologies, specifically XML, for the formal description of biometric tests. The HEF was used to facilitate the administration of the Face Recognition Vendor Test (FRVT) 2002. Unlike FRVT 2000 or the FERET 1996 evaluations, FRVT 2002 used a large number (over 100,000) of both still and video facial imagery, warranting the development of a more sophisticated and regular means of describing data presented to the participants. The HEF is one component in NIST’s ongoing effort to address the need in the biometrics community for a common evaluation framework.

Keywords

Facial Image Evaluation Framework Biometric Data Biometric System Single Dataset 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

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    Blake, C. L. & Merz, C. J. (1998). UCI Repository of machine learning databases. http://www.ics.uci.edu/$\sim$mlearn/MLRepository.html. Irvine, CA: Universityi of California. Department of Information and Computer Science.
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    P. Grother, R. J. Micheals, and P. J. Philips. Face Recognition Vendor Test 2002 Performance Metrics. These proceedings.Google Scholar
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    P. J. Phillips, P. Grother, R. J. Micheals, D.M. Blackburn, E. Tabassi and M. Bone. Face Recognition Vendor Test 2002. Evaluation Report IR 6964, National Institute of Standards and Technology, http://www.itl.nist.gov/iad/894.03/face/face.html, March 2003.
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    Oasis XML Common Biometric Format (XCBF). http://www.oasis-open.org/committees/xcbf/
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    XML Schema Part 0: Primer. http://www.w3.org/TR/xmlschema-0/

Copyright information

© Springer-Verlag Berlin Heidelberg 2003

Authors and Affiliations

  • Ross J. Micheals
    • 1
  • Patrick Grother
    • 1
  • P. Jonathon Phillips
    • 1
  1. 1.National Institute of Standards and TechnologyGaithersburgUSA

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