Advertisement

Testing Transition Systems with Input and Output Testers

  • Alexandre Petrenko
  • Nina Yevtushenko
  • Jia Le Huo
Conference paper
Part of the Lecture Notes in Computer Science book series (LNCS, volume 2644)

Abstract

The paper studies testing based on input/output transition systems, also known as input/output automata. It is assumed that a tester can never prevent an implementation under test (IUT) from producing outputs, while the IUT does not block inputs from the tester, either. Thus, input from the tester and output from the IUT may occur simultaneously and should be queued in finite buffers between the tester and the IUT. A framework for so-called queued-quiescence testing is developed, based on the idea that the tester should consist of two test processes, one applying inputs via a queue to an IUT and the other reading outputs from a queue until it detects no more outputs of the IUT, i.e., the tester detects quiescence of the IUT. The testing framework is then extended with so-called queued-suspension testing by considering a tester that has several pairs of input and output processes. Test derivation procedures are elaborated with a fault model in mind.

Keywords

conformance testing test generation input/output transition system fault model 

References

  1. 1.
    Bochmann, G. v., Petrenko, A.:Protocol Testing: Review of Methods and Relevance for Software Testing. In: The Proceedings of the ACM International Symposium on Software Testing and Analysis, ISSTA’94. USA (1994)Google Scholar
  2. 2.
    Brinksma, E., Tretmans, J.: Testing Transition Systems: An Annotated Bibliography. In: Cassez, F., Jard, C., Rozoy, B., Ryan, M. (eds.): Modeling and Verification of Parallel Processes. Lecture Notes in Computer Science, Vol. 2067. Springer-Verlag, Berlin Heidelberg New York (2001)CrossRefGoogle Scholar
  3. 3.
    van Glabbeek, R. J.: The Linear Time-Branching Time Spectrum. In: The Proceedings of CONCUR’90. Lecture Notes In Computer Science, Vol. 458. Springer-Verlag, Berlin Heidelberg New York (1990)Google Scholar
  4. 4.
    Jard, C., Jéron, T., Tanguy, L., Viho, C.: Remote Testing Can Be as Powerful as Local Testing. In: The Proceedings of the IFIP Joint International Conference, Methods for Protocol Engineering and Distributed Systems, FORTE XII/PSTV XIX. China (1999)Google Scholar
  5. 5.
    Lynch, N., Tuttle, M. R.: An Introduction to Input/Output Automata. In: CWI Quarterly, Vol. 2, Issue 3 (1989)Google Scholar
  6. 6.
    Petrenko, A.: Fault Model-Driven Test Derivation from Finite State Models: Annotated Bibliography. In: Cassez, F., Jard, C., Rozoy, B., Ryan, M. (eds.): Modeling and Verification of Parallel Processes. Lecture Notes in Computer Science, Vol. 2067. Springer-Verlag, Berlin Heidelberg New York (2001)CrossRefGoogle Scholar
  7. 7.
    Petrenko, A., Yevtushenko, N.: Queued Testing of Transition Systems with Inputs and Outputs. In: Hierons, R., Jeron, T. (eds.): INRIA preprint, the Proceedings of the Workshop on Formal Approaches to Testing of Software, FATES’02, A Satellite Workshop of CONCUR’02. Czech Republic (2002)Google Scholar
  8. 8.
    Petrenko, A., Yevtushenko, N., Bochmann, G. v., Dssouli, R.: Testing in Context: Framework and Test Derivation. In: Computer Communications, Vol. 19 (1996)Google Scholar
  9. 9.
    Phalippou, M.: Executable Testers. In: The Proceedings of the IFIP Sixth International Workshop on Protocol Test Systems, IWPTS’93. France (1993)Google Scholar
  10. 10.
    Segala, R.: Quiescence, Fairness, Testing and the Notion of Implementation. In: The Proceedings of CONCUR’93. Lecture Notes in Computer Science, Vol. 715. Springer-Verlag, Berlin Heidelberg New York (1993)Google Scholar
  11. 11.
    Tan, Q. M., Petrenko, A.: Test Generation for Specifications Modeled by Input/Output Automata. In: The Proceedings of the IFIP 11th International Workshop on Testing of Communicating Systems, IWTCS’98. Russia (1998)Google Scholar
  12. 12.
    Tretmans, J.: Test Generation with Inputs, Outputs and Repetitive Quiescence. In: Software-Concepts and Tools, Vol. 17, Issue 3 (1996)Google Scholar
  13. 13.
    Vaandrager, F.: On the Relationship between Process Algebra and Input/Output Automata. In: The Proceedings of Sixth Annual IEEE Symposium on Logic in Computer Science (1991)Google Scholar
  14. 14.
    Verhaard, L., Tretmans, J., Kim, P., Brinksma, E.: On Asynchronous Testing. In: The Proceedings of the IFIP 5th International Workshop on Protocol Test Systems, IWPTS’92. Canada (1992)Google Scholar
  15. 15.
    de Vries, R. G., Belinfante, A., Feenstra, J.: Automated Testing in Practice: The Highway Tolling System. In: The Proceedings of the IFIP 14th International Conference on Testing of Communicating Systems, Test Com’2002. Berlin, Germany (2002)Google Scholar

Copyright information

© IFIP 2003

Authors and Affiliations

  • Alexandre Petrenko
    • 1
  • Nina Yevtushenko
    • 2
  • Jia Le Huo
    • 3
  1. 1.Centre de recherche informatique de MontréalCRIMMontrealCanada
  2. 2.Tomsk State UniversityTomskRussia
  3. 3.Department of Electrical and Computer EngineeringMcGill UniversityMontrealCanada

Personalised recommendations