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Chemical composition and strain distribution of InAs/GaAs(001) stacked quantum rings

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Part of the book series: Springer Proceedings in Physics ((SPPHY,volume 107))

Abstract

The strain and composition distributions of InAs/GaAs(001) stacked self-assembled quantum rings (QRs) grown by MBE have been analyzed. Transmission electron microscopy (TEM) images revealed a high degree of vertical arrangement of quantum rings for samples spaced by a GaAs spacer layer thickness ts < 6 nm. The peak finding method was applied to high resolution transmission electron micrographs in order to plot strain maps, revealing that the higher strained areas were in the ring core and close to it. The existence of another layer with similar strain to the wetting layer was also clear from the peak finding strain analysis. The transverse compositional profiles taken from 002 DF TEM images show the existence of In-rich regions within the nano-rings and an In(Ga)As well defined layer surrounding them, which is formed during the growth process.

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© 2005 Springer-Verlag Berlin Heidelberg

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Ben, T., Sánchez, A.M., Molina, S.I., Granados, D., García, J.M., Kret, S. (2005). Chemical composition and strain distribution of InAs/GaAs(001) stacked quantum rings. In: Cullis, A.G., Hutchison, J.L. (eds) Microscopy of Semiconducting Materials. Springer Proceedings in Physics, vol 107. Springer, Berlin, Heidelberg . https://doi.org/10.1007/3-540-31915-8_56

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