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References
International Tables for Crystallpgraphy, Vol. C, 2nd ed., (A.J.C. Wilson, E. Prince eds.), Mathematical, Physical and Chemical Tables, pp.206–211, IUCr, Kluwer Academic Pub., Dordrecht (1999).
C. Urey, Phys, Rev., 11, 401 (1918).
K. Kohra, S. Kikuta, X-Ray Diffraction Techniques, p. 61, Tokyo Univ. Press (1979) (in Japanese).
a) Synchrotron Radiation (Phys. Soc. Jpn. ed.), Baifukan (1986). b) URL. http://www.spring8.or.jp/e/general.info/overview/
A. Guinier, Thérie et Technique de la Radiocristallographie, 3rd ed., p.14, Dunod Editeur, Paris (1964).
a) R.W. James, The Optical Principles of the Diffraction of X-Rays, p.54, G. Bell & Sons, London (1948). b) In ref. 6a) p. 172.
a) M. Sonoda, M. Takano, J. Miyahara, H. Kato. Radiology, 148, 833 (1983). b) Y. Amemiya, J. Miyahara. Nature, 336, 89 (1988). c) J. Miyahara, K. Takahashi, Y. Amemiya, N. Kamiya, Y. Satow, Nuclear Instr. Methods, A246, 572 (1986).
A. F. H. Muggleton, Nuclear Instr. Methods, 101, 113 (1972).
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(2005). Essential Properties of X-Rays. In: X-Ray Diffraction by Macromolecules. Springer Series in Chemical Physics, vol 80. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-28353-6_1
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DOI: https://doi.org/10.1007/3-540-28353-6_1
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