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Sensor Technology for Scanning Probe Microscopy and New Applications

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Book cover Applied Scanning Probe Methods II

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Authors and Affiliations

  1. Fachbereich Physik Physik und Technologie der Nanostrukturen, Universität Kaiserslautern, Erwin-Schrödinger Straße, 67653, Kaiserslautern, Germany

    Egbert Oesterschulze

  2. Systems and Materials for Information storage group, MESA + Research Institute, P.O. Box 217, 7500 AE, Enschede, The Netherlands

    Leon Abelmann & Arnout van den Bos

  3. Institute for Microstructure Technologies and Analytics, IMA Technological Physics, University of Kassel, Heinrich-Plett-Str. 40, D-34132, Kassel, Germany

    Rainer Kassing

  4. Technische Universität Kaiserslautern, Erwin-Schrödinger Strasse, 67663, Kaiserslautern, Germany

    Nicole Lawrence & Christiane Ziegler

  5. Carl von Ossietzky Universität Oldenburg, Carl von Ossietzky Str. 9-11, 26129, Oldenburg, Germany

    Gunther Wittstock

Authors
  1. Egbert Oesterschulze
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  2. Leon Abelmann
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  3. Arnout van den Bos
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  4. Rainer Kassing
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  5. Nicole Lawrence
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  6. Gunther Wittstock
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  7. Christiane Ziegler
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Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), The Ohio State University, 650 Ackerman Road, Suite 255, Columbus, OH, 43202-1107, USA

    Bharat Bhushan

  2. Center for Nanotechnology (CeNTech) and Institute of Physics, University of Münster, Gievenbecker Weg 11, 48149, Münster, Germany

    Harald Fuchs

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Oesterschulze, E. et al. (2006). Sensor Technology for Scanning Probe Microscopy and New Applications. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods II. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27453-7_6

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