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Raffa, V., Castrataro, P., Menciassi, A., Dario, P. (2006). Focused Ion Beam as a Scanning Probe: Methods and Applications. In: Bhushan, B., Fuchs, H. (eds) Applied Scanning Probe Methods II. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27453-7_11
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