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Ultrafast Phenomena XIV pp 124–126Cite as

Spatially encoded spectral interferometry for complete characterisation of attosecond XUV pulses

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Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 79))

Abstract

We propose a variant of the spectral phase interferometry for direct electric field reconstruction (SPIDER) technique for characterisation of attosecond pulses directly in the XUV by spatially encoding the phase information onto an interferogram.

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References

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Author information

Authors and Affiliations

  1. CELIA, Université Bordeaux I, 351, Cours de la Libération, 33405, TalenceCEDEX, France

    Eric Cormier

  2. Clarendon Laboratory, University of Oxford, Parks Road, Oxford, 0X1 3PU, UK

    Ian A. Walmsley, Ellen M. Kosik & Laura Corner

  3. The Institute of Optics, University of Rochester, Rochester, New York, 14627, USA

    Ellen M. Kosik

  4. Brookhaven National Laboratory, Upton, New York, 11973, USA

    Louis F. DiMauro

Authors
  1. Eric Cormier
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  2. Ian A. Walmsley
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  3. Ellen M. Kosik
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  4. Laura Corner
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  5. Louis F. DiMauro
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Editor information

Editors and Affiliations

  1. Department of Physics, University of Tokyo, Hongo 7-3-1, Bunkyo, Tokyo, 113-0033, Japan

    Takayoshi Kobayashi

  2. Toyota Physical and Chemical Research Institute Nagakute, Aichi, 480-1192, Japan

    Tadashi Okada

  3. Engineering Science, Osaka University, Machikaneyama-Cho 1-3, Toyonaka, Osaka, 560-8531, Japan

    Tetsuro Kobayashi

  4. MIT Room 6-235, 77 Massachusetts Avenue, Cambridge, MA, 02139, USA

    Keith A. Nelson

  5. Dipartimento di Fisica, Politecnico di Milano, Piazza L. da Vinci 32, 20133, Milano, Italy

    Sandro De Silvestri

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© 2005 Springer-Verlag Berlin Heidelberg

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Cite this paper

Cormier, E., Walmsley, I.A., Kosik, E.M., Corner, L., DiMauro, L.F. (2005). Spatially encoded spectral interferometry for complete characterisation of attosecond XUV pulses. In: Kobayashi, T., Okada, T., Kobayashi, T., Nelson, K.A., De Silvestri, S. (eds) Ultrafast Phenomena XIV. Springer Series in Chemical Physics, vol 79. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27213-5_40

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