This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
P. Strehl: Ion beam diagnostics, in: B. Wolf (editor), Handbook of Ion Sources, CRC Press, Boca Raton, 1995, p. 385
NEC: Pelletrons, vacuum components and beam-handling catalog
H. Büttig: Nucl. Instr. Meth. 203 (1982) 69
F. Loyer: Proc. 11th Int. Conf. on Cyclotrons and their Applications, 1987, Tokyo, p. 449
G. Norton: Pramana — J. Phys. 95 (2002) 745
HVEE: Beam-profiling system manual A-4-35-253
V.Y. Mikhailov, V.V. Leonov, V.A. Rezvov, A.A. Roschin, V.I. Sklyarenko, L.I. Yudin, A.I. Artemev, T.Y. Rakhimbabaev: Instr. Exp. Techn. 38 (1995) 717
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 Springer-Verlag Berlin Heidelberg
About this chapter
Cite this chapter
Friedrich, M. (2005). Equipment for Beam Diagnostics. In: Hellborg, R. (eds) Electrostatic Accelerators. Particle Acceleration and Detection. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-27095-7_24
Download citation
DOI: https://doi.org/10.1007/3-540-27095-7_24
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-23983-3
Online ISBN: 978-3-540-27095-9
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)