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Electrical and optical measuring techniques for flaw states

  • Part I. Defect Diagnostics
  • Conference paper
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Defect Complexes in Semiconductor Structures

Part of the book series: Lecture Notes in Physics ((LNP,volume 175))

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Authors and Affiliations

  1. Oregon Graduate Center, 97006, Beaverton, Oregon, USA

    J. S. Blakemore

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  1. J. S. Blakemore
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J. Giber F. Beleznay I. C. Szép J. László

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© 1983 Springer-Verlag

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Blakemore, J.S. (1983). Electrical and optical measuring techniques for flaw states. In: Giber, J., Beleznay, F., Szép, I.C., László, J. (eds) Defect Complexes in Semiconductor Structures. Lecture Notes in Physics, vol 175. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-11986-8_4

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  • DOI: https://doi.org/10.1007/3-540-11986-8_4

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  • Online ISBN: 978-3-540-39456-3

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