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On the field dependence of capture and emission processes at deep centres

  • Part III. Defects in Silicon
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Defect Complexes in Semiconductor Structures

Part of the book series: Lecture Notes in Physics ((LNP,volume 175))

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Authors and Affiliations

  1. Sektion Physik, Humboldt-Universität zu Berlin, Invalidenstr. 42, 1040, Berlin, Germany

    H. Klose, K. Irmscher & K. Maass

Authors
  1. H. Klose
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  2. K. Irmscher
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  3. K. Maass
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Editor information

J. Giber F. Beleznay I. C. Szép J. László

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© 1983 Springer-Verlag

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Klose, H., Irmscher, K., Maass, K. (1983). On the field dependence of capture and emission processes at deep centres. In: Giber, J., Beleznay, F., Szép, I.C., László, J. (eds) Defect Complexes in Semiconductor Structures. Lecture Notes in Physics, vol 175. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-11986-8_14

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  • DOI: https://doi.org/10.1007/3-540-11986-8_14

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-11986-9

  • Online ISBN: 978-3-540-39456-3

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