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Universelle Klassen O(log(MxN))-testbarer iterativer und sequentieller Schaltungen

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GI — 5. Jahrestagung (GI 1975)

Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 34))

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5. Literatur

  1. G. Hotz, Schaltkreistheorie, Berlin, 1974.

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  2. A.D. Friedman/P.R. Menon, Fault Detection in Digital Systems, Englewood Cliffs, 1971.

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  3. W. Görke, Fehlerdiagnose digitaler Schaltungen, Stuttgart, 1973.

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  4. W. Coy, On the realization of arbitrary switching functions with a linear number of tests, in J. Rosenfeld (Hrsg.), Information Processing 74, Amsterdam, 1974.

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  5. W. Coy, Zur Konstruktion einfach testbarer Schaltkreise, (erscheint in Elektronische Informationsverarbeitung und Kybernetik).

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  6. A.D. Friedman, Easily testable iterative systems, IEEE Trans. Comp., Vol. C-22, pp. 1061–1064, Dez. 1973.

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  7. R.W. Landgraff/ S.S. Yau, Design of diagnosable iterative arrays, IEEE Trans. Comp., Vol. C-21, pp. 1183–1188, Nov. 1972.

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  8. J.M. Galey/R.E. Norby/J.P. Roth, Techniques for the diagnosis of switching circuit failures, IEEE Trans. Comm. Elec., Vol. 83, pp. 509–514, Sept. 1964.

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  9. W. Coy, Testkomplexität als Entwurfskriterium, Berichte der Informatik-Forschungsgruppen Nr. AFS-16, Technische Hochschule Darmstadt, Darmstadt, 1975.

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  10. S.B. Akers, Universal test sets for logic networks, IEEE Trans. Comp. Vol. C-22, No. 9, pp. 835–839, Sept. 1973.

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Authors and Affiliations

  1. Technische Hochschule Darmstadt, Germany

    Wolfgang Coy

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  1. Wolfgang Coy
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J. Mülbacher

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© 1975 Springer-Verlag Berlin Heidelberg

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Coy, W. (1975). Universelle Klassen O(log(MxN))-testbarer iterativer und sequentieller Schaltungen. In: Mülbacher, J. (eds) GI — 5. Jahrestagung. GI 1975. Lecture Notes in Computer Science, vol 34. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-07410-4_657

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  • DOI: https://doi.org/10.1007/3-540-07410-4_657

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-07410-6

  • Online ISBN: 978-3-540-37929-4

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