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International Conference on Artificial Intelligence and Soft Computing

ICAISC 2006: Artificial Intelligence and Soft Computing – ICAISC 2006 pp 113–122Cite as

RBF Nets in Faults Localization

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Part of the book series: Lecture Notes in Computer Science ((LNAI,volume 4029))

Abstract

The task of faults localization is discussed in a model-free setting. As a tool for its solution we consider a multiclass pattern recognition problem with a metric in the label space. Then, this problem is approximately solved, providing hints on selecting appropriate RBF nets. It was shown that the approximate solution is the exact one in several important cases. Finally, we propose the algorithm for learning the proposed RBF net. The results of its testing are briefly reported.

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Author information

Authors and Affiliations

  1. Institute of Computer Engineering, Control and Robotics, Wrocław University of Technology, Wybrzeże Wyspiańskiego 27, 50 370, Wrocław, Poland

    Ewaryst Rafajłowicz

Authors
  1. Ewaryst Rafajłowicz
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Editor information

Editors and Affiliations

  1. Department of Artificial Intelligence, Academy of Humanities and Economics, Poland

    Leszek Rutkowski

  2. Institute of Automatics, AGH University of Science and Technology, Al. Mickiewicza 30, PL-30-059, Kraków, Poland

    Ryszard Tadeusiewicz

  3. Department of Electrical Engineering and Computer Sciences, Berkeley Initiative in Soft Computing (BISC), University of California, 94720-1776, Berkeley, CA, USA

    Lotfi A. Zadeh

  4. Department of Electrical Engineering, University of Louisville, 40292, Louisville, KY, U.S.A

    Jacek M. Żurada

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© 2006 Springer-Verlag Berlin Heidelberg

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Rafajłowicz, E. (2006). RBF Nets in Faults Localization. In: Rutkowski, L., Tadeusiewicz, R., Zadeh, L.A., Żurada, J.M. (eds) Artificial Intelligence and Soft Computing – ICAISC 2006. ICAISC 2006. Lecture Notes in Computer Science(), vol 4029. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11785231_13

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  • DOI: https://doi.org/10.1007/11785231_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-35748-3

  • Online ISBN: 978-3-540-35750-6

  • eBook Packages: Computer ScienceComputer Science (R0)

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