Abstract
The 20 workflow patterns proposed by Van der Aalst et al. provide a comprehensive benchmark for comparing control flow aspects of process modelling languages. In this paper, we present a novel class of Event-Driven Process Chains (EPCs) that is able to capture all of these patterns. This class is called “yet another” EPC as a tribute to YAWL that inspired this research. yEPCs extend EPCs by the introduction of the so-called empty connector; inclusion of multiple instantiation concepts; and a cancellation construct. Furthermore, we illustrate how yEPCs can be used to model some of the workflow patterns.
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Mendling, J., Neumann, G., Nüttgens, M. (2005). Yet Another Event-Driven Process Chain. In: van der Aalst, W.M.P., Benatallah, B., Casati, F., Curbera, F. (eds) Business Process Management. BPM 2005. Lecture Notes in Computer Science, vol 3649. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11538394_35
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DOI: https://doi.org/10.1007/11538394_35
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-540-28238-9
Online ISBN: 978-3-540-31929-0
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