Abstract
Test driven development (TDD) is one of the key Agile practices. A version of CppUnitLite was modified to meet the memory and speed constraints present on self-contained, high performance, digital signal processing (DSP) systems. The specific characteristics of DSP systems required that the concept of refactoring be extended to include concepts such as “refactoring for speed”. We provide an experience report describing the instructor-related advantages of introducing an embedded test driven development tool E-TDD into third and fourth year undergraduate Computer Engineering Hardware-Software Co-design Laboratories. The TDD format permitted customer (instructor) hardware and software tests to be specified as “targets” so that the requirements for the components and full project were known “up-front”. Details of CppUnitLit extensions necessary to permit tests specific for a small hardware-software co-design project, and lessons learnt when using the current E-TDD tool, are given. The next stage is to explore the use of the tool in an industrial context of a video project using the hybrid communication-media (HCM) dual core Analog Devices ADSP-BF561 Blackfin processor.
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References
Tassey, G.: The Economic Impacts of Inadequate Infrastructure for Software Testing. National Institute of Standards and Technology Report (2002)
Dahlby, D.: Applying Agile Methods to Embedded Systems Development. Embedded Software Design Resources 41, 101–123 (2004)
Feathers, M.: CppUnitLite Source code (December 2004), http://c2.com/cgi/wiki?CppUnitLite
Analog Devices Blackfin and TigerSHARC DSP.User and hardware manuals (December 2004), http://www.analog.com/dsp
Smith, M., Martin, A., Huang, L., Bariffi, M., Kwan, A., Flaman, W., Geras, A., Miller, J.: A look at test driven development (TDD) in the embedded environment: Part 1. Circuit Cellar magazine 176, 34–39 ( March 2005)
Smith, M., Martin, A., Huang, L., Bariffi, M., Kwan, A., Flaman, W., Geras, A., Miller, J.: A look at test driven development (TDD) in the embedded environment: Part 2. Circuit Cellar magazine 177, 60–67 (2005)
Fowler, M.: Refactoring: Improving the Design of Existing Code. he Addison-Wesley Object Technology Series. Addison-Wesley, Reading (1999)
Williams, L., Kessler, R.R., Cunningham, W., Jeffries, R.: Strengthening the case for pair programming. IEEE Transactions on Software Engineering, 19-25 (2000)
Feathers, M.C.: Working Effectively with Legacy Code. Prentice Hall PTR, Upper Saddle River (2005)
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© 2005 Springer-Verlag Berlin Heidelberg
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Smith, M., Kwan, A., Martin, A., Miller, J. (2005). E-TDD – Embedded Test Driven Development a Tool for Hardware-Software Co-design Projects. In: Baumeister, H., Marchesi, M., Holcombe, M. (eds) Extreme Programming and Agile Processes in Software Engineering. XP 2005. Lecture Notes in Computer Science, vol 3556. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11499053_17
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DOI: https://doi.org/10.1007/11499053_17
Publisher Name: Springer, Berlin, Heidelberg
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