Skip to main content

Software Defect Analysis of a Multi-release Telecommunications System

  • Conference paper
Product Focused Software Process Improvement (PROFES 2005)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3547))

Abstract

This paper provides a study of several process metrics of an industrial large-scale embedded software system, the Lucent product Lambda-UniteTM MSS. This product is an evolutionary hardware/software system for the metropolitan and wide-area transmission and switching market. An analysis of defect data is performed, including and comparing all major (i.e. feature) releases till end of 2004. Several defect metrics on file-level are defined and analyzed, as basis for a defect prediction model. Main analysis results include the following. Faults and code size per file show only a weak correlation. Portion of faulty files per release tend to decrease across releases. Size and error-proneness in previous release alone is not a good predictor of a file’s faults per release. Customer-found defects are strongly correlated with pre-delivery defects found per subsystem. These results are being compared to a recent similar study of fault distributions; the differences are significant.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. Lucent Technologies: LambdaUniteTM MultiService Switch (MSS) product description, Online at http://www.lucent.com/solutions/core_optical.html

  2. Leszak, M., Brunck, W., Moessler, G.: Analysis of Software Defects in a Large Evolutionary Telecommunication System. In: 12th Int. Workshop on Software Measurement (IWSM), Magdeburg, Germany. Shaker Publ. (2002)

    Google Scholar 

  3. Fenton, N.E., Ohlson, N.: Quantitative Analysis of Faults and Failures in a Complex Software System. IEEE Trans. on SW Engineering 26(8), 797–814 (2000)

    Article  Google Scholar 

  4. Hartman, P.: Utility of Popular Software Defect Models. In: Proc. IEEE Reliability and Maintainability Symposium (2002)

    Google Scholar 

  5. Gana, A., Huang, S.T.: Statistical Modeling Applied to Managing Global 5ESS-2000 Switch Software Development. Bell Labs Techn. Journal, 144–153 (Winter 1997)

    Google Scholar 

  6. Leszak, M., Perry, D.E., Stoll, D.: A Case Study in Root Cause Defect Analysis. In: IEEE International Conference on Software Engineering (ICSE-22), Limerick/Ireland (June 2000)

    Google Scholar 

  7. Leszak, M.: Practical Product and Process Measurement - Lessons Learned from 6 Years of Experience. DASMA Software Metrik Kongress (MetriKon 2001), Dortmund, Germany (October 2001)

    Google Scholar 

  8. Leszak, M., Perry, D.E., Stoll, D.: Classification and Evaluation of Defects in a Project Retrospective. Journal of Systems and Software 61(3), 173–187 (2002)

    Article  Google Scholar 

  9. Stoll, D., Leszak, M., Heck, T.: Measuring Process and Product Characteristics of Software Components - A Case Study. In: 3rd Conf. on Quality Engineering in Software Technology (Conquest), Nuernberg, Germany (September 1999)

    Google Scholar 

  10. Li, P.L., Shaw, M., Herbsleb, J.D.: Selecting a Defect Prediction Model for Maintenance Resource Planning and Software Insurance. In: Position paper for the Fifth Workshop on Economics-Driven Software Research (EDSER-5), affiliated with the 25th International Conference on Software Engineering (2003), Online at http://www-2.cs.cmu.edu/%7ECompose/li%2Bedser5.pdf

  11. Li, P., Shaw, M., Herbsleb, J., Ray, B., Santhanam, P.: Empirical Evaluation of Defect Projection Models for Widely-deployed Production Software Systems. In: ACM Symposium on the Foundations of Software Engineering (2004)

    Google Scholar 

  12. Ostrand, T.J., Weyuker, E.J.: The distribution of faults in a large industrial software system. In: ACM SIGSOFT Int. Symp. on Software Testing and Analysis (2002)

    Google Scholar 

  13. Ostrand, T.J., Weyuker, E.J., Bell, R.M.: Where the bugs are. In: ACM SIGSOFT Int. Symp. on Software Testing and Analysis (2004)

    Google Scholar 

  14. Ostrand, T.J., Weyuker, E.J.: A Tool for Mining Defect-Tracking Systems to Predict Fault-Prone Files. In: Proc. MSR 2004: International Workshop on Mining Software Repositories, affiliated with the 26th International Conference on Software Engineering (2004), Online at http://msr.uwaterloo.ca/papers/Ostrand.pdf

  15. Denaro, G., Pezzè, M.: Software evaluation: An empirical evaluation of fault-proneness models. In: IEEE 24th Int. Conference on Software Engineering (2002)

    Google Scholar 

  16. Mockus, A., Weiss, D.M., Zhang, P.: Understanding and predicting effort in software projects. In: IEEE 25th Int. Conference on Software Engineering, Portland, Oregon (May 2003)

    Google Scholar 

  17. Zuse, H.: Lecture on Defect-Density, Online at http://irb.cs.tu-berlin.de/~zuse/metrics/lecture02.html

  18. Tian, J.: Quality-Evaluation Models and Measurements. IEEE Software 21(3), 84–91 (2004)

    Article  Google Scholar 

  19. Park, R.E.: Software Size Measurement: A Framework for Counting Source Statements. Tech. Report CMU/SEI-92-TR- 20. SEI, Carnegie Mellon Univ., Pittsburgh (1992)

    Google Scholar 

  20. Leszak, M.: The Versatility of Software Defect Prediction Models (or why it’s so hard to replicate related Case Studies). In: 14th Int. Workshop on SW Measurement (IWSM/ Metrikon), November 2004. Shaker Publ., Berlin (2004)

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2005 Springer-Verlag Berlin Heidelberg

About this paper

Cite this paper

Leszak, M. (2005). Software Defect Analysis of a Multi-release Telecommunications System. In: Bomarius, F., Komi-Sirviö, S. (eds) Product Focused Software Process Improvement. PROFES 2005. Lecture Notes in Computer Science, vol 3547. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11497455_10

Download citation

  • DOI: https://doi.org/10.1007/11497455_10

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-26200-8

  • Online ISBN: 978-3-540-31640-4

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics