Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
D. Gabor, Proc. Roy. Soc. London, A197 (1949) 454.
A. Tonomura, L. F. Allard, G. Pozzi, D. C. Joy, and Y. A. Ono (Eds.), Electron Holography, Elsevier, Amsterdam (1995).
E. Vöolkl, L. F. Allard, and D. C. Joy (Eds.), Introduction to Electron Holography, Plenum, New York (1998).
A. Tonomura, Electron Holography, Springer-Verlag, Berlin (1999).
H. Lichte, Adv. Opt. Elect. Microsc. 12 (1991) 25.
A. Tonomura, Adv. Phys. 41 (1992) 59.
P. A. Midgley, Micron 32 (2001) 167.
R. E. Dunin-Borkowski, M. R. McCartney, and D. J. Smith, In: Encyclopedia of Nanoscience and Nanotechnology, H. S. Nalwa (Ed.), American Scientific, Stevenson Ranch, CA (2004).
J. M. Cowley, Ultramicroscopy 41 (1992) 335.
J. M. Cowley, Diffraction Physics, Third Revised Edition, North Holland, Amsterdam (1995).
K. Ishizuka, Ultramicroscopy 51 (1993) 1.
L. Reimer, Transmission Electron Microscopy, Springer, Berlin (1991).
J. C. H. Spence, Acta Cryst, A49 (1993) 231.
M. A. van Hove, W. H. Weinberg, and C. M. Chan, Low Energy Electron Diffraction, Springer, Berlin (1986).
D. K. Saldin and J. C. H. Spence, Ultramicroscopy 55 (1994) 397.
M. Gajdardziska-Josifovska, M. R. McCartney, W. J. de Ruijter, D. J. Smith, J. K. Weiss, and J. M. Zuo, Ultramicroscopy 50 (1993) 285.
M. Gajdardziska-Josifovska and A. Carim, In: Introduction to Electron Holography, E. Völkl, L. F. Allard, and D. C. Joy (Eds.), Kluwer, New York (1998) pp. 267–293.
J. Li, M. R. McCartney, R. E. Dunin-Borkowski, and D. J. Smith, Acta Cryst. 55 (1999) 652.
W. J. de Ruijter and J. K. Weiss, Ultramicroscopy 50 (1993) 269.
W. J. de Ruijter and J. K. Weiss, Rev. Sci. Inst. 63 (1992) 4314.
W. O. Saxton, T. J. Pitt, and M. Horner, Ultramicroscopy 4 (1979) 343.
W. D. Rau, H. Lichte, E. Völkl, and U. Weierstall, J. Comp-Assisted Microsc. 3 (1991) 51.
H. Lichte, Ultramicroscopy 20 (1986) 293.
H. Lichte, Ultramicroscopy 51 (1993) 15.
A. Harscher and H. Lichte, Ultramicroscopy 64 (1996) 57.
H. Lichte, K.-H. Herrmann, and F. Lenz, Optik 77 (1987) 135.
D. J. Smith, W. J. de Ruijter, M. R. McCartney, and J. K. Weiss, In: Introduction to Electron Holography, E. Völkl, L. F. Allard, and D. C. Joy (Eds.), Kluwer, New York (1998) pp. 107–124.
D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms and Software, Wiley, New York (1998).
E. Völkl, L. F. Allard, and B. Frost, Ultramicroscopy 58 (1995) 97.
D. J. Smith and M. R. McCartney, In: Introduction to Electron Holography, E. Völkl, L. F. Allard, and D. C. Joy (Eds.), Kluwer, New York (1998) pp. 87–106.
M. R. McCartney, D. J. Smith, R. F. C. Farrow, and R. F. Marks, J. Appl. Phys. 82 (1997) 2461.
R. E. Dunin-Borkowski, M. R. McCartney, B. Kardynal, S. S. P. Parkin, M. R. Scheinfein, and D. J. Smith, J. Microscopy 200 (2000) 187.
S. M. Sze, Physics of Semiconductor Devices, Wiley, New York (2002).
S. Frabonni, G. Matteucci, G. Pozzi, and U. Valdre, Phys. Rev. Lett. 44 (1985) 2196.
M. R. McCartney, D. J. Smith, R. Hull, J. C. Bean, E. Völkl, and B. Frost, Appl. Phys. Lett. 65 (1994) 2603.
M. R. McCartney, M. A. Gribelyuk, J. Li, P. Ronsheim, J. S. McMurray, and D. J. Smith, Appl. Phys. Lett. 80 (2002) 3213.
M. A. Gribelyuk, M. R. McCartney, J. Li, C. S. Murthy, P. Ronsheim, B. Doris, J. S. McMurray, S. Hegde, and D. J. Smith, Phys. Rev. Lett. 89 (2002) 025502.
A. Twitchett, R. E. Dunin-Borkowski, and P. A. Midgley, Phys. Rev. Lett. 88 (2002) 238302.
A. Twitchett, R. E. Dunin-Borkowski, R. F. Broom, and P. A. Midgley, J. Phys. Condens. Matt. 16 (2004) S181.
W. D. Rau, P. Schwander, F. H. Baumann, W. Hoppner, and A. Ourmazd, Phys. Rev. Lett 82 (1999) 2614.
J. Li, M. R. McCartney, and D. J. Smith, Ultramicroscopy 94 (2003) 149.
H. MorkocNitride Semiconductors and Devices, Springer, Berlin (1999).
J. Barnard and D. Cherns, J. Electron Microscopy 49 (2000) 281.
D. Cherns, H. Mokhtari, C. G. Jaio, R. Averback, and H. Riechert, J. Cryst. Growth 230 (2001) 410.
J. Cai and F. A. Ponce, J. Appl. Phys. 91 (2002) 9856.
J. Cai, F. A. Ponce, S. Tanaka, H. Omiya, and Y. Nakagawa, phys. stat. sol. (a) 188 (2001) 833.
M. R. McCartney, F. A. Ponce, J. Cai, and D. P. Bour, Appl. Phys. Lett. 76 (2000) 3055.
J. Cai and F. A. Ponce, phys. stat. sol. (a) 192 (2002) 407.
D. Cherns and C. G. Jiao, Phys. Rev. Lett. 87 (2001) 5504.
C. G. Jiao and D. Cherns, J. Electron Microscopy 51 (2002) 105.
I.-H. Tan, G. L. Snider, L. D. Chang, and E. L. Hu, J. Appl. Phys. 68 (1990) 4071.
A. Krtschil, A. Dadger, and A. Krosy, Appl. Phys. Lett. 82 (2003) 2263.
H.-J. Im, Y. Ding, J. P. Pelz, B. Heying, and J. S. Speck, Phys. Rev. Lett. 87 (2001) 106802.
R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes, Imperial College Press, London (1999).
J. Cumings, A. Zettl, M. R. McCartney, and J. C. H. Spence, Phys. Rev. Lett. 88 (2002) 056804.
L. F. Allard, E. Völkl, D. S. Kalakkad, and A. K. Datye, J. Mater. Sci. 29 (1994) 5612.
L. F. Allard, E. Völkl, A. Carim, A. K. Datye, and R. Ruoff, Nano. Mater. 7 (1996) 137.
M. R. McCartney and M. Gajardziska-Josifovska, Ultramicroscopy 53 (1994) 283.
M. Gajdardziska-Josifovska and M. R. McCartney, Ultramicroscopy 53 (1994) 291.
J. K. Weiss, W. J. de Ruijter, M. Gajdardziska-Josifovska, M. R. McCartney, and D. J. Smith, Ultramicroscopy 50 (1993) 301.
M. Gajdardziska-Josifovska, MSA Bulletin 24 (1994) 507.
Y. Miura, J. Magn. Magn. Mater. 134 (1994) 209.
J. N. Chapman and M. R. Scheinfein, J. Magn. Magn. Mater. 200 (1999) 729.
R. E. Dunin-Borkowski, M. R. McCartney, B. Kardynal, and D. J. Smith, J. Appl. Phys 84 (1998) 374.
R. E. Dunin-Borkowski, M. R. McCartney, B. Kardynal, D. J. Smith, and M. R. Scheinfein, Appl. Phys. Lett. 75 (1999) 2641.
D. J. Smith, R. E. Dunin-Borkowski, M. R. McCartney, B. Kardynal, and M. R. Scheinfein, J. Appl. Phys. 87 (2000) 7400.
R. E. Dunin-Borkowski, M. R. McCartney, B. Kardynal, M. R. Scheinfein, D. J. Smith, and S. S. P. Parkin, J. Appl. Phys. 90 (2001) 2899.
S. S. P. Parkin, Ann. Rev. Mater. Sci. 25 (1995) 357.
D. A. Bazylinski and R. B. Frankel, In: Biomineralization: From Biology to Biotechnology, E. Bauerlein (Ed.), Wiley-VCH, Weinheim (2000).
R. E. Dunin-Borkowski, M. R. McCartney, R. B. Frankel, D. A. Bazylinski, M. P’osfai, and P. R. Buseck, Science 282 (1998) 1868.
R. E. Dunin-Borkowski, M. R. McCartney, M. Pösfai, R. B. Frankel, D. A. Bazylinski, and P. R. Buseck, Eur. J. Mineral. 13 (2001) 671.
M. R. McCartney, U. Lins, M. Farina, P. R. Buseck, and R. B. Frankel, Eur. J. Mineral. 13 (2001) 685.
M. J. Hÿtch, R. E. Dunin-Borkowski, J. Moulin, C. Duhamel, F. Mazaleyrat, and Y. Champion, Phys. Rev. Lett. 91 (2003) 257207.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 Kluwer Academic Publishers
About this chapter
Cite this chapter
McCartney, M.R., Dunin-Borkowski, R.E., Smith, D.J. (2005). Off-Axis Electron Holography. In: Yao, N., Wang, Z.L. (eds) Handbook of Microscopy for Nanotechnology. Springer, Boston, MA. https://doi.org/10.1007/1-4020-8006-9_20
Download citation
DOI: https://doi.org/10.1007/1-4020-8006-9_20
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-8003-6
Online ISBN: 978-1-4020-8006-7
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)