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Lorentz Microscopy and Holography Characterization of Magnetic Materials

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Handbook of Advanced Magnetic Materials

Abstract

In order to understand the properties of advanced magnetic materials, it is necessary to make clear both their microstructure and magnetic domain structure. Transmission electron microscopes can be utilized for characterization in both microstructure and magnetic domain structure. In the present chapter transmission electron microscopy for observing the magnetic domain structure, i. e., Lorentz microscopy and electron holography are presented. Some analytical methods which are useful for magnetic domain structure analysis are also presented prior to Lorentz microscopy and electron holography.

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Author information

Authors and Affiliations

  1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, 980-8577, Japan

    Daisuke Shindo & Young-Gil Park

Authors
  1. Daisuke Shindo
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  2. Young-Gil Park
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Editor information

Editors and Affiliations

  1. Center for Materials Research and Analysis, University of Nebraska, Lincoln, Nebraska

    Yi Liu  & David J. Sellmyer  & 

  2. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan

    Daisuke Shindo

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Shindo, D., Park, YG. (2006). Lorentz Microscopy and Holography Characterization of Magnetic Materials. In: Liu, Y., Sellmyer, D.J., Shindo, D. (eds) Handbook of Advanced Magnetic Materials. Springer, Boston, MA. https://doi.org/10.1007/1-4020-7984-2_11

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