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Structural Characterization of Er:Yag Thin Films Grown by Pulsed Laser Deposition

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Functional Properties of Nanostructured Materials

Part of the book series: Nato Science Series ((NAII,volume 223))

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Abstract

Thin films of erbium-doped yttrium aluminum garnet (Er:Y3Al5O12) were grown by pulsed laser deposition (PLD) followed by high temperature annealing. Such films are very appropriate for use in planar waveguide lasers and can be used in medical and telecommunication applications as well.

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References

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Author information

Authors and Affiliations

  1. Laser-Surface-Plasma Interactions Laboratory, National Institute for Lasers, Plasma and Radiations Physics, Lasers Department, Romania

    D. Stanoi, E. Axente, G. Socol, G. Dorcioman, S. Grigorescu & I. N. Mihailescu

Authors
  1. D. Stanoi
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  2. E. Axente
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  3. G. Socol
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  4. G. Dorcioman
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  5. S. Grigorescu
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  6. I. N. Mihailescu
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Editor information

Editors and Affiliations

  1. Department of Natural Sciences, University of Kassel, Germany

    Rainer Kassing

  2. Department of Physics, University of Chemical Technology and Metallurgy, Sofia, Bulgaria

    Plamen Petkov

  3. Department of Natural Sciences, University of Kassel, Germany

    Wilhelm Kulisch

  4. Central Laboratory of Photoprocesses, Bulgarian Academy of Sciences, Sofia, Bulgaria

    Cyril Popov

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© 2006 Springer

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Stanoi, D., Axente, E., Socol, G., Dorcioman, G., Grigorescu, S., Mihailescu, I. (2006). Structural Characterization of Er:Yag Thin Films Grown by Pulsed Laser Deposition. In: Kassing, R., Petkov, P., Kulisch, W., Popov, C. (eds) Functional Properties of Nanostructured Materials. Nato Science Series, vol 223. Springer, Dordrecht. https://doi.org/10.1007/1-4020-4594-8_31

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