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The Charge-Free Zone Model for Conductive Cracks in Dielectric and Piezoelectric Ceramics

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IUTAM Symposium on Mechanics and Reliability of Actuating Materials

Part of the book series: Solid Mechanics and Its Applications ((SMIA,volume 127))

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Abstract

In the charge-free zone (CFZ) model, dielectric and piezoelectric ceramics are treated to be mechanically brittle and electrically ductile. For an electrically conductive crack under electrical and/or mechanical loading, various charge emission mechanisms may function jointly at the tip due to the high electric field concentration. Charge emission and charge trapping consume more work and thus lead to a high value of the electric toughness. The failure criterions derived from the CFZ model were verified by experimental results on poled and thermally depoled lead zirconate titanate ceramics.

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© 2006 Springer

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Zhang, TY. (2006). The Charge-Free Zone Model for Conductive Cracks in Dielectric and Piezoelectric Ceramics. In: Yang, W. (eds) IUTAM Symposium on Mechanics and Reliability of Actuating Materials. Solid Mechanics and Its Applications, vol 127. Springer, Dordrecht. https://doi.org/10.1007/1-4020-4131-4_10

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  • DOI: https://doi.org/10.1007/1-4020-4131-4_10

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-1-4020-4130-3

  • Online ISBN: 978-1-4020-4131-0

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