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The Effect of the Field of Residual Strains on the n-Beam X-Ray Diffraction on Diamond

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Innovative Superhard Materials and Sustainable Coatings for Advanced Manufacturing

Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 200))

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Abstract

In the present work we have studied single crystals of natural diamonds, diamonds synthesized in the Ni-Mn-C and Ni-Mn-C+B growth systems as well as diamonds grown by the temperature gradient method. Experimental study of the intensity profiles of the Kossel lines have shown that for the equivalent crystallographic directions, the halfwidths of extinction lines differ and the bifurcation of Kα1 and Kα2 lines appear from some planes of the lattice. The use of the dynamic theory of X-ray scattering for a case of the periodic strain of the diamond lattice has allowed us to substantiate theoretical profiles of the Kossel lines that qualitatively coincide with experimental data.

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Tkach, V., Tkach, O., Borcha, M., Fodchuk, I., Tkach, O., Kshevetsky, O. (2005). The Effect of the Field of Residual Strains on the n-Beam X-Ray Diffraction on Diamond. In: Lee, J., Novikov, N., Turkevich, V. (eds) Innovative Superhard Materials and Sustainable Coatings for Advanced Manufacturing. NATO Science Series II: Mathematics, Physics and Chemistry, vol 200. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3471-7_25

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