Abstract
The paper describes the possibility of producing a focused parametric X-ray radiation (PXR) without applying any special X-ray optics. The PXR is emitted by relativistic charged particles that are channeling along a bent crystal. The PXR emitted from the whole length of the bent crystal is brought into focus. Some properties of focused PXR are estimated for typical experimental conditions, its possible applications are discussed. Besides, the feasibility of diffraction of parametric X-ray radiation emitted by relativistic particles in a bent crystal is described for the first time. The PXR generated at one set of crystallographic planes may be diffracted by another set of crystallographic planes in the same bent crystal. In the example being, the PXR is emitted in the backward direction from the crystallographic planes perpendicular to the trajectory of particles channeling along a thin long bent crystal. Then, it reaches the region of the bent crystal, where the Bragg condition is fulfilled for another crystallographic plane, and undergoes diffraction at a right angle. After diffraction, the PXR escapes from the thin crystal and becomes focused. Some properties of the diffracted focused PXR are estimated for typical experimental conditions. The experiment for observation of focused non-diffracted and diffracted PXR is proposed. Besides, possibilities for diffraction, extraction and focusing of crystal undulator radiation, as well as focusing of channeling radiation from a long crystal are proposed.
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Shchagin, A. (2006). DIFFRACTION, EXTRACTION AND FOCUSING OF PARAMETRIC X-RAY RADIATION, CHANNELING RADIATION AND CRYSTAL UNDULATOR RADIATION FROM A BENT CRYSTAL. In: Wiedemann, H. (eds) Advanced Radiation Sources and Applications. NATO Science Series II: Mathematics, Physics and Chemistry, vol 199. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3450-4_03
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DOI: https://doi.org/10.1007/1-4020-3450-4_03
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