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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials pp 199–222Cite as

Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials

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Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 186))

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Author information

Authors and Affiliations

  1. Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, 37831

    S.V. Kalinin

  2. Department of Materials Science and Engineering, The University of Pennsylvania, 3231 Walnut St, Philadelphia, PA, 19104

    D.A. Bonnell

Authors
  1. S.V. Kalinin
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  2. D.A. Bonnell
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Editor information

Editors and Affiliations

  1. University of Aveiro, Portugal

    Paula Maria Vilarinho

  2. Tel Aviv University, Ramat - Aviv, Israel

    Yossi Rosenwaks

  3. NCSU, Raleigh, NC, USA

    Angus Kingon

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© 2005 Kluwer Academic Publishers

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Kalinin, S., Bonnell, D. (2005). Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_9

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