Abstract
Using the noncontact atomic force microscope (NC-AFM), we investigated functions of NC-AFM. As a result, we found that the NC-AFM works not only the atomic resolution microscope but also novel atomic tools based on a mechanical method such as a three-dimensional mapping tool of atomic force between the tip and sample atoms, a discrimination tool of atomic force mechanisms between the tip and sample atoms, a discrimination tool of atom species on the sample surface, a control tool of atomic force between the tip and sample atoms, a control tool of atom position on the sample surface, and an atom manipulation tool.
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Morita, S. et al. (2005). Functions of NC-AFM on Atomic Scale. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_8
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DOI: https://doi.org/10.1007/1-4020-3019-3_8
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-3017-8
Online ISBN: 978-1-4020-3019-2
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