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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials pp 333–354Cite as

Nanometer-Scale Electronics and Storage

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Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 186))

Abstract

The ability to control the placement of molecules is essential for the patterning and fabrication of nanoscale electronic devices. We apply selective chemistry and self-assembly in combination with conventional nanolithographic techniques to reach higher resolution, greater precision, and chemical versatility in the nanostructures that we create. We illustrate three successful approaches: (1) phase separation of self-assembled monolayers (SAMs) by terminal and internal functionalization, (2) phase separation of SAMs induced by post-adsorption processing and (3) control of molecular placement by insertion into a self-assembled monolayer. These methods demonstrate the possibilities of patterning films by exploiting the intrinsic properties of the molecules. We then employ these self-assembled monolayers as a means to isolate molecules with electronic function to determine the mechanisms of function, and the relationships between molecular structure, environment, connection, coupling, and function. Using self-assembly techniques in combination with scanning tunneling microscopy (STM) we are able to study candidate molecular switches individually and in small bundles. Alkanethiolate SAMs on gold are used as a host two-dimensional matrix to isolate and to insulate electrically the molecular switches. We then individually address and electronically probeeach moleculeusing STM. The conjugated molecules exhibit reversible conductance switching, manifested as a change in the topographic height in the STM images. The origins of switching and the relevant aspects of the molecular structure and environment required will be discussed.

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Authors and Affiliations

  1. Departments of Chemistry and Physics, The Pennsylvania State University, 152 Davey Laboratory, University Park, PA, 16802-6300, USA

    K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith & P.S. Weiss

  2. Department of Electrical Engineering, Rice University, Houston, TX, 77251, USA

    K.F. Kelly

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  1. K.F. Kelly
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  2. Z.J. Donhauser
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  3. P.A. Lewis
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  4. R.K. Smith
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Editor information

Editors and Affiliations

  1. University of Aveiro, Portugal

    Paula Maria Vilarinho

  2. Tel Aviv University, Ramat - Aviv, Israel

    Yossi Rosenwaks

  3. NCSU, Raleigh, NC, USA

    Angus Kingon

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© 2005 Kluwer Academic Publishers

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Kelly, K., Donhauser, Z., Lewis, P., Smith, R., Weiss, P. (2005). Nanometer-Scale Electronics and Storage. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_15

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