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SFM-Based Methods for Ferroelectric Studies

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 186))

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Authors and Affiliations

  1. North Carolina State University, Raleigh, NC, 27695-7920

    A. Gruverman

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  1. A. Gruverman
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  1. University of Aveiro, Portugal

    Paula Maria Vilarinho

  2. Tel Aviv University, Ramat - Aviv, Israel

    Yossi Rosenwaks

  3. NCSU, Raleigh, NC, USA

    Angus Kingon

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© 2005 Kluwer Academic Publishers

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Gruverman, A. (2005). SFM-Based Methods for Ferroelectric Studies. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_10

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