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Transient Conditions: Program and Erase

Theory, compact modeling and circuit simulations

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Floating Gate Devices: Operation and Compact Modeling

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(2004). Transient Conditions: Program and Erase. In: Floating Gate Devices: Operation and Compact Modeling. Springer, Boston, MA. https://doi.org/10.1007/1-4020-2613-7_4

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  • DOI: https://doi.org/10.1007/1-4020-2613-7_4

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