Abstract
Recent theoretical and experimental findings have raised interest in the issue of shot noise suppression and enhancement in nanostructures. Several theoretical predictions have already been confirmed by means of sophisticated experiments, but further work is needed to improve the achievable sensitivity of noise measurements.
We have been working on the integration of several different noise reduction techniques, with the objective of being able to measure the shot noise levels associated with currents of less than a picoampere. We combine the usage of correlation amplifiers, cryogenic cooling of the active elements and feedback resistors, correction techniques based on the substitution impedance method, and the precise evaluation of the transfer function of the amplifiers.
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References
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© 2004 Kluwer Academic Publisher
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Pellegrini, B., Basso, G., Macucci, M. (2004). Techniques for High-Sensitivity Measurements of Shot Noise in Nanostructures. In: Sikula, J., Levinshtein, M. (eds) Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices. NATO Science Series II: Mathematics, Physics and Chemistry, vol 151. Springer, Dordrecht. https://doi.org/10.1007/1-4020-2170-4_23
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DOI: https://doi.org/10.1007/1-4020-2170-4_23
Publisher Name: Springer, Dordrecht
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