Estimating the Mean of Exponential Distribution from Step-Stress Life Test Data

  • Zhenmin Chen
  • Jie Mi
  • Yan Yan Zhou
Part of the Statistics for Industry and Technology book series (SIT)


This paper considers the step-stress accelerated life tests (ALT) on an exponential population with mean θ. The MLEs of θ are studied for different data structures that include grouped data and censored data. Here, by grouped data we mean that instead of observing the exact failure times, only numbers of failures in some predetermined subintervals are available. Applying the tampered failure rate (TFR) model, we show the existence, uniqueness, strong consistency, and the asymptotic normality of the MLE of θ. An upper bound of the MLE of θ based on the grouped data is also derived.

Keywords and phrases

Exponential distribution step-stress ALT TFR model type-I censored data type-II censored data grouped data 


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Copyright information

© Birkhäuser Boston 2006

Authors and Affiliations

  • Zhenmin Chen
    • 1
  • Jie Mi
    • 1
  • Yan Yan Zhou
    • 1
  1. 1.Florida International UniversityMiamiUSA

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