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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits pp 151–223Cite as

Testing Defects and Parametric Variations in RAMs

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Authors and Affiliations

  1. University of Waterloo, Ontario, Canada

    Manoj Sachdev

  2. Philips Research Laboratories, Eindhoven University of Technology, Eindhoven, The Netherlands

    José Pineda de Gyvez

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  1. Manoj Sachdev
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  1. University of Waterloo, Ontario, Canada

    Manoj Sachdev

  2. Philips Research Laboratories, Eindhoven University of Technology, Eindhoven, The Netherlands

    José Pineda de Gyvez

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Sachdev, M., Gyvez, J.P.d. (2007). Testing Defects and Parametric Variations in RAMs. In: Sachdev, M., Gyvez, J.P.d. (eds) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, vol 34. Springer, Boston, MA. https://doi.org/10.1007/0-387-46547-2_5

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