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Sachdev, M., Gyvez, J.P.d. (2007). Functional and Parametric Defect Models. In: Sachdev, M., Gyvez, J.P.d. (eds) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits. Frontiers in Electronic Testing, vol 34. Springer, Boston, MA. https://doi.org/10.1007/0-387-46547-2_2
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