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Theory of Forces

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Part of the NanoScience and Technology book series (NANO)

Keywords

Interaction Energy Work Function Surface Charge Density Atomistic Simulation Tunneling Current 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    J.N. Israelachvili. Intermolecular and Surface Forces. Academic Press, London, 1991.Google Scholar
  2. 2.
    F. London. Trans. Faraday Soc., 33:8, 1937.CrossRefGoogle Scholar
  3. 3.
    P. J. W. Debye. Phys. Z., 21:178, 1920.Google Scholar
  4. 4.
    P. J. W. Debye. Phys. Z., 22:302, 1921.Google Scholar
  5. 5.
    Communications Physical Laboratory. Leyden, Holland, 1912.Google Scholar
  6. 6.
    H. C. Hamaker. Physica, 4:1058, 1937.CrossRefGoogle Scholar
  7. 7.
    E. M. Lifshitz. Sov. Phys. JETP, 2:73, 1956.Google Scholar
  8. 8.
    C. Argento and R. H. French. Parametric tip model and force-distance relation for hamaker constant determination from atomic force microscopy. J. Appl. Phys., 80:6081, 1996.CrossRefGoogle Scholar
  9. 9.
    L. N. Kantorovich, A. S. Foster, A. L. Shluger, and A. M. Stoneham. Role of image forces in NC-SFM images of ionic surfaces. Surf. Sci., 445:283, 2000.CrossRefGoogle Scholar
  10. 10.
    J. M. Pitarke, P. M. Echenique, and F. Flores. Surf. Sci., 217:267, 1989.CrossRefGoogle Scholar
  11. 11.
    L. N. Kantorovich, A. I. Livshits, and A. M. Stoneham. Electrostatic energy calculation for the interpretation of surface probe microscopy experiments. J. Phys.: Condens. Matter, 12:795, 2000.CrossRefGoogle Scholar
  12. 12.
    S. Hudlet, M. Saint Jean, C. Guthmann, and J. Burger. Eur. Phys. J., 2:5, 1998.Google Scholar
  13. 13.
    M. Saint Jean, S. Hudlet, C. Guthmann, and J. Berger. J. Appl. Phys., 86:5245, 1999.CrossRefGoogle Scholar
  14. 14.
    N.A. Burnham, R.J. Colton, and H.M. Pollock. Interpretation of force curves in force microscopy. Nanotechnology, 4:64, 1993.CrossRefGoogle Scholar
  15. 15.
    N.A. Burnham, R.J. Colton, and H.M. Pollock. Phys. Rev. Lett., 69:144, 1992.CrossRefGoogle Scholar
  16. 16.
    J. B. Engelhardt, H. Dabringhaus, and K. Wandelt. Surf. Sci., 448:187, 2000.CrossRefGoogle Scholar
  17. 17.
    M. Luna, F. Rieutord, N. A. Melman, Q. Dai, and M. Salmeron. J. Phys. Chem. A, 102:6793, 1998.CrossRefGoogle Scholar
  18. 18.
    L. B. Harris and J. Fiasson. J. Phys. C: Solid State Phys., 18:4845, 1985.CrossRefGoogle Scholar
  19. 19.
    H. J. Wintle. Meas. Sci. Technol., 8:508, 1997.CrossRefGoogle Scholar
  20. 20.
    J. Jang, G. C. Schatz, and M. A. Ratner. J. Chem. Phys., 120:1157, 2004.CrossRefGoogle Scholar
  21. 21.
    Y. I. Rabinovich, J. J. Adler, M. S. Esayanur, A. Ata, R. K. Singh, and B. M. Moudgil. Adv. Coll. Int. Sci., 96:213, 2002.CrossRefGoogle Scholar
  22. 22.
    T. Stifter, O. Marti, and B. Bhushan. Phys. Rev. B, 62:13667, 2000.CrossRefGoogle Scholar
  23. 23.
    O. H. Pakarinen, A. S. Foster, M. Paajanen, T. Kalinainen, J. Katainen, I. Makkonen, J. Lahtinen, and R. M. Nieminen. Modelling Simul. Mater. Sci., 13:1175, 2005.CrossRefGoogle Scholar
  24. 24.
    H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger. Appl. Phys. A, 72:S35, 2001.CrossRefGoogle Scholar
  25. 25.
    R. Pérez, M. C. Payne, I. Stich, and K. Terakura. Phys. Rev. Lett., 78:678, 1997.CrossRefGoogle Scholar
  26. 26.
    B. G. Dick and A. W. Overhauser. Phys. Rev., 112:603, 1958.CrossRefGoogle Scholar
  27. 27.
    K. Ohno, K. Esfarjani, and Y. Kawazoe. Computational Materials Science. Springer, Berlin, 1999.Google Scholar
  28. 28.
    P. Hohenberg and W. Kohn. Phys. Rev., 136:B864, 1964.CrossRefGoogle Scholar
  29. 29.
    W. Kohn and L. J. Sham. Phys. Rev, 140:A1133, 1965.CrossRefGoogle Scholar
  30. 30.
    C. Kittel. Quantum Theory of Solids. John Wiley and Sons, New York, 1963.Google Scholar
  31. 31.
    J. Bardeen. Phys. Rev. Lett., 6:57, 1961.CrossRefGoogle Scholar
  32. 32.
    C. J. Chen. Introduction to Scanning Tunneling Microscopy. Oxford University Press, Oxford, 1993.Google Scholar
  33. 33.
    W.A. Hofer and J. Redinger. Surf. Sci., 447:51, 2000.CrossRefGoogle Scholar
  34. 34.
    M. Bütticker, Y. Imry, R. Landauer, and S. Pinhas. Phys. Rev. B, 31:6207, 1985.CrossRefGoogle Scholar
  35. 35.
    T. E. Feuchtwang. Phys. Rev. B, 13:517, 1976.CrossRefGoogle Scholar
  36. 36.
    S. Hembacher, F. J. Giessibl, J. Mannhart, and C. F. Quate. Phys. Rev. Lett., 94:056101, 2005.CrossRefGoogle Scholar
  37. 37.
    G. Rubio-Pollinger, P. Joyez, and N. Agrait. Phys. Rev. Lett., 93:116803, 2004.CrossRefGoogle Scholar

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