SPM: The Instrument

Part of the NanoScience and Technology book series (NANO)


Experimental Development Atomic Resolution American Physical Society Scanning Tunneling Spectroscopy Surface Electronic Structure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    I. Giaever. Phys. Rev. Lett., 5:147, 1960.CrossRefGoogle Scholar
  2. 2.
    I. Giaever. Phys. Rev. Lett., 5:464, 1960.CrossRefGoogle Scholar
  3. 3.
    G. Binnig and H. Rohrer. Helv. Phys. Acta, 55:726, 1982.Google Scholar
  4. 4.
    G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel. Appl. Phys. Lett., 40:178, 1982.CrossRefGoogle Scholar
  5. 5.
    G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel. Phys. Rev. Lett., 49:57, 1982.CrossRefGoogle Scholar
  6. 6.
    G. Binnig, C.F. Quate, and C. Gerber. Phys. Rev. Lett., 56:930, 1986.CrossRefGoogle Scholar
  7. 7.
    H-J. Güntherodt, D. Anselmetti, and E. Meyer, editors. Forces in Scanning Probe Methods. Kluwer, Dordrecht, 1995.Google Scholar
  8. 8.
    S. Morita, R. Wiesendanger, and E. Meyer, editors. Noncontact Atomic Force Microscopy. Springer, Berlin, 2002.Google Scholar
  9. 9.
    D. A. Bonnell. Probe Microscopy and Spectroscopy: Theory, Techniques and Applications. Wiley, New York, 2000.Google Scholar
  10. 10.
    R. J. Driscoll, M. G. Youngquist, and J. D. Baledschwieler. Nature, 346:294, 1990.CrossRefGoogle Scholar
  11. 11.
    F. Ohnesorge and G. Binnig. Science, 260:1451, 1993.CrossRefGoogle Scholar
  12. 12.
    A. Engel and D. J. Müller. Nature Structural Biology, 7:715, 2000.CrossRefGoogle Scholar
  13. 13.
    K. D. Jandt. Surf. Sci., 491:303, 2001.CrossRefGoogle Scholar
  14. 14.
    P. J. James, M. Antognozzi, J. Tamayo, T. J. McMaster, J. M. Newton, and M. J. Miles. Langmuir, 17:349, 2001.CrossRefGoogle Scholar
  15. 15.
    T. Aoki, Y. Sowa, H. Yokota, M. Hiroshima, M. Tokunaga, Y. Ishii, and T. Yanagida. Single Mol., 2:183, 2001.CrossRefGoogle Scholar
  16. 16.
    A. Philippsen, W. Im, A. Engel, T. Schirmer, B. Roux, and D. J. Mller. Biophys. J., 82:1667, 2002.Google Scholar
  17. 17.
    W. Hebenstreit, M. Schmid, J. Redinger, and P. Varga. Phys. Rev. Lett., 85:5376, 2000.CrossRefGoogle Scholar
  18. 18.
    S. Schintke, S. Messerli, M. Pivetta, F. Patthey, L. Libouille, M. Stengel, A. de Vita, and W.-D. Schneider. Phys. Rev. Lett., 87:276801, 2001.CrossRefGoogle Scholar
  19. 19.
    R. J. Behm, N. Garcia, and H. Rohrer. Scanning Tunneling Microscopy and Related Methods. Kluwer, Dordrecht, 1990.Google Scholar
  20. 20.
    C. J. Chen. Introduction to Scanning Tunneling Microscopy. Oxford University Press, Oxford, 1993.Google Scholar
  21. 21.
    S.-W. Hla, L. Bartels, G. Meyer, and K.-H. Rieder. Phys. Rev. Lett., 85:2777, 2000.CrossRefGoogle Scholar
  22. 22.
    J. R. Hahn and W. Ho. Phys. Rev. Lett., 87:166102, 2001.CrossRefGoogle Scholar
  23. 23.
    K. I. Fukui, H. Onishi, and Y. Iwasawa. Chem. Phys. Lett., 280:296, 1997.CrossRefGoogle Scholar
  24. 24.
    A. Sasahara, H. Uetsuka, and H. Onishi. J. Phys. Chem. B, 105:1, 2001.CrossRefGoogle Scholar
  25. 25.
    T. Nishiguchi, M. Kageshima, N. Ara-Kato, and A. Kawazu. Phys. Rev. Lett., 81:3187, 1998.CrossRefGoogle Scholar
  26. 26.
    P. Molinas-Mata, A. J. Mayne, and G. Dujardin. Phys. Rev. Lett., 80:3101, 1998.CrossRefGoogle Scholar
  27. 27.
    J. J. Schulz, M. Sturmat, and R. Koch. Phys. Rev. B, 62:15402, 2000.CrossRefGoogle Scholar
  28. 28.
    L. J. Lauhon and W. Ho. Phys. Rev. Lett., 85:4566, 2000.CrossRefGoogle Scholar
  29. 29.
    P. Hoffmann, S. Jeffrey, J. B. Pethica, H. Özgür Özer, and A. Oral. Phys. Rev. Lett., 87:265502, 2001.CrossRefGoogle Scholar
  30. 30.
    R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schär, M. Guggisberg, E. Meyer, and A. L. Shluger. Phys. Rev. B, 62:2074, 2000.CrossRefGoogle Scholar
  31. 31.
    A. Biedermann. Instrumentelle Optimierung eines Ultrahochvakuum-Rastertunnelmikroskops und Messungen an Graphit-and Silizium-und Platin-Nickel-Einkristall-oberflächen. Diplomarbeit, Technische Universität, Wien, 1991.Google Scholar
  32. 32.
    M. A. Lantz, H. J. Hug, P. J. A. van Schendel, R. Hoffmann, S. Martin, A. Baratoff, A. Abdurixit, H. J. Güntherodt, and Ch. Gerber. Phys. Rev. Lett., 84:2642, 2000.CrossRefGoogle Scholar
  33. 33.
    W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger. Rev. Sci. Instrum., 69:221, 1998.CrossRefGoogle Scholar
  34. 34.
    M. Schmid. Gallery, 1998.Google Scholar
  35. 35.
    Basel. 2000.Google Scholar
  36. 36.
    A. L. Shluger, A. I. Livshits, A. S. Foster, and C. R. A. Catlow. J. Phys.: Condens. Matter, 11:R295, 1999.CrossRefGoogle Scholar
  37. 37.
    F. J. Giessibl. Jpn. J. Appl. Phys., 33:3726, 1994.CrossRefGoogle Scholar
  38. 38.
    F. J. Giessibl. Phys. Rev. B, 56:16010, 1997.CrossRefGoogle Scholar
  39. 39.
    Y. Martin, C. C. Williams, and H. K. Wickramasinghe. J. Appl. Phys., 61:4723, 1987.CrossRefGoogle Scholar
  40. 40.
    R. García and R. Pérez. Surf. Sci. Rep., 47:197, 2002.CrossRefGoogle Scholar
  41. 41.
    T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar. J. Appl. Phys., 69:668, 1991.CrossRefGoogle Scholar
  42. 42.
    F. Moreno-Herrero, J. Colchero, J. Gómez-Herrero, and A. M. Baró. Phys. Rev. E, 69:031915, 2004.CrossRefGoogle Scholar
  43. 43.
    Courtesy of Omicron Nanotechnology. 2004.Google Scholar
  44. 44.
    M. M. J. Bischoff, C. Konvicka, A. J. Quinn, M. Schmid, J. Redinger, R. Podloucky, P. Varga, and H. van Kempen. Phys. Rev. Lett., 86:2396, 2001.CrossRefGoogle Scholar
  45. 45.
    G. A. D. Briggs and A. J. Fisher. Surf. Sci. Rep., 33:1, 1999.CrossRefGoogle Scholar
  46. 46.
    F. J. Himpsel, J. E. Ortega, G. J. Mankey, and F. F. Willis. Adv. Phys., 47:511, 1998.CrossRefGoogle Scholar
  47. 47.
    K. F. Braun and K. H. Rieder. Phys. Rev. Lett., 88:096801, 2002.CrossRefGoogle Scholar
  48. 48.
    R. Wiesendanger and M. Bode. Solid State Comm., 119:341, 2001.CrossRefGoogle Scholar
  49. 49.
    J. R. Hahn and W. Ho. Phys. Rev. Lett., 87:196102, 2001.CrossRefGoogle Scholar
  50. 50.
    T. Nishino, Ph. Bühlmann, T. Ito, and Y. Umezawa. Surf. Sci. Lett., 490:L579, 2001.CrossRefGoogle Scholar
  51. 51.
    M. P. L. Wertz, E. W. van der Vegte, and G. Hadziioannou. Langmuir, 13:4939, 1997.CrossRefGoogle Scholar
  52. 52.
    B. Capella and G. Dietler. Surf. Sci. Rep., 34:1, 1999.CrossRefGoogle Scholar
  53. 53.
    G. Cross, A. Schirmeisen, A. Stalder, P. Grutter, and U. Durig. Phys. Rev. Lett., 80:4685, 1998.CrossRefGoogle Scholar
  54. 54.
    M. F. Crommie, C. P. Lutz, and D. M. Eigler. Phys. Rev. B, 48:2851, 1993.CrossRefGoogle Scholar
  55. 55.
    R. M. Feenstra, J. A. Stroscio, and A. P. Fein. Surf. Sci., 181:295, 1987.CrossRefGoogle Scholar
  56. 56.
    T. Eguchi and Y. Hasegawa. Phys. Rev. Lett., 89:266105, 2002.CrossRefGoogle Scholar
  57. 57.
    F. J. Giessibl, S. Hembacher, H. Bielefeldt, and J. Mannhart. Science, 289:422, 2000.CrossRefGoogle Scholar
  58. 58.
    A. S. Foster, W. A. Hofer, and A. L. Shluger. Curr. Op. Sol. State Mater. Sci., 5:427, 2001.CrossRefGoogle Scholar
  59. 59.
    A. R. H. Clarke, J. B. Pethica, J. A. Nieminen, F. Besenbacher, E. Laegsgaard, and I. Stensgaard. Phys. Rev. Lett., 76:1276, 1996.CrossRefGoogle Scholar
  60. 60.
    W. A. Hofer, J. Redinger, and P. Varga. Solid State Comm., 113:245, 1999.CrossRefGoogle Scholar
  61. 61.
    W. A. Hofer, J. Redinger, and R. Podloucky. Phys. Rev. B, 64:125108, 2001.CrossRefGoogle Scholar
  62. 62.
    W.A. Hofer and J. Redinger. Surf. Sci., 447:51, 2000.CrossRefGoogle Scholar
  63. 63.
    D. M. Zehner, J. R. Noolan, H. L. Davis, and C. W. White. J. Vac. Sci. Tech., 18:852, 1981.CrossRefGoogle Scholar
  64. 64.
    G. J. R. Jones and B. W. Holland. Solid State Commun., 53:45, 1985.CrossRefGoogle Scholar
  65. 65.
    G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel. Phys. Rev. Lett., 50:120, 1983.CrossRefGoogle Scholar
  66. 66.
    V. M. Hallmark, S. Chiang, J. F. Raboli, J. D. Swalen, and R. J. Wilson. Phys. Rev. Lett., 59:2879, 1987.CrossRefGoogle Scholar
  67. 67.
    P. Han, E. C. H. Sykes, T. P. Pearl, and P. S. Weiss. J. Phys. Chem. A, 107:8124, 2003.CrossRefGoogle Scholar
  68. 68.
    D. T. Pierce. Phys. Scr., 38:291, 1988.Google Scholar
  69. 69.
    R. Wiesendanger, H.-J. Güntherodt, G. Güntherodt, R. J. Gambino, and R. Ruf. Phys. Rev. Lett., 65:247, 1990.CrossRefGoogle Scholar
  70. 70.
    R. Wiesendanger, D. Bürgler D, G. Tarrach G, A. Wadas, D. Brodbeck, H. J. Güntherodt, G. Güntherodt, R. J. Gambino, and R. Ruf. J. Vac. Sci. Technol. B, 9:519, 1991.CrossRefGoogle Scholar
  71. 71.
    W. Wulfhekel, H. F. Ding, W. Lutzke, G. Steierl, M. Vazquez, P. Marin, A. Hernando, and J. Kirschner. J. Appl. Phys., 72:463, 2001.Google Scholar
  72. 72.
    M. Bode. Rep. Progr. Phys., 66:523, 2003.CrossRefGoogle Scholar
  73. 73.
    M. Bode, R. Pascal, and R. Wiesendanger. J. Vac. Sci. Technol. A, 15:1285, 1997.CrossRefGoogle Scholar
  74. 74.
    F. J. Giessibl. Science, 267:68, 1995.Google Scholar
  75. 75.
    K. Takayanagi, Y. Tanishiro, M. Takahashi, and S. Takahashi. J. Vac. Sci. Technol., A3:1502, 1981.Google Scholar
  76. 76.
    R. Pérez, M. C. Payne, I. Stich, and K. Terakura. Phys. Rev. Lett., 78:678, 1997.CrossRefGoogle Scholar
  77. 77.
    M. Huang, M. Čuma, and F. Liu. Phys. Rev. Lett., 90:256101, 2003.CrossRefGoogle Scholar
  78. 78.
    N. Oyabu, ó. Custance, I. Yi, Y. Sugawara, and S. Morita. Phys. Rev. Lett., 90:176102, 2003.CrossRefGoogle Scholar
  79. 79.
    M. Bammerlin, R. Lüthi, E. Meyer, A. Baratoff, M. Guggisberg, C. Gerber, L. Howard, and H.-J. Güntherodt. Probe Microscopy, 1:3, 1997.Google Scholar
  80. 80.
    M. Bammerlin, R. Lüthi, E. Meyer, J. Lü, M. Guggisberg, C. Loppacher, C. Gerber, and H. J. Güntherodt. Appl. Phys. A, 66, 1998.Google Scholar
  81. 81.
    A. I. Livshits, A. L. Shluger, A. L. Rohl, and A. S. Foster. Phys. Rev. B, 59:2436, 1999.CrossRefGoogle Scholar
  82. 82.
    C. Barth and C. R. Henry. Phys. Rev. Lett., 91:196102, 2003.CrossRefGoogle Scholar
  83. 83.
    C. Barth and M. Reichling. Nature, 414:54, 2001.CrossRefGoogle Scholar
  84. 84.
    R. Bennewitz, M. Bammerlin, M. Guggisberg, C. Loppacher, A. Baratoff, E. Meyer, and H.-J. Güntherodt. Surf. Interface Anal., 27:462, 1999.CrossRefGoogle Scholar
  85. 85.
    H. Hosoi, K. Sueoka, K. Hayakawa, and K. Mukasa. Appl. Surf. Sci., 157, 2000.Google Scholar
  86. 86.
    W. Allers, S. Langkat, and R. Wiesendanger. Appl. Phys. A, 72:S27, 2001.CrossRefGoogle Scholar
  87. 87.
    R. Hoffmann, M. A. Lantz, H. J. Hug, P. J. A van Schendel, P. Kappenberger, S. Martin, A. Baratoff, and H. J. Güntherodt. Phys. Rev. B, 67:085402, 2003.CrossRefGoogle Scholar
  88. 88.
    S. M. Langkat, H. HÖlscher, A. Schwarz, and R. Wiesendanger. Surf. Sci., 527:12, 2003.CrossRefGoogle Scholar
  89. 89.
    A. S. Foster and A. L. Shluger. Surf. Sci., 490:211, 2001.CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2006

Personalised recommendations