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The Physics of Scanning Probe Microscopes

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Part of the NanoScience and Technology book series (NANO)

Keywords

Scanning Tunneling Microscope Theoretical Method Local Probe Scanning Probe Microscope Electron Energy Loss Spectroscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Further reading

Introduction

  1. C. Julian Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, Oxford (1993).Google Scholar
  2. Roland Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications, Cambridge University Press, Cambridge (1994).Google Scholar

Intermediate

  1. R. J. Behm, N. Garcia, and H. Rohrer, Scanning Tunneling Microscopy and Related Methods, Kluwer, Dordrecht (1990).Google Scholar
  2. D. A. Bonnell, Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, Wiley and Sons, New York (2000).Google Scholar
  3. Ernst Meyer, Atomic Force Microscopy: Fundamentals to Most Advanced Applications, Springer-Verlag, New York (2002).Google Scholar

In depth

  1. H. J. Güntherodt and R. Wiesendanger (editors), Scanning Tunneling Microscopy, Volumes I–III, 2nd edition. Springer-Verlag, Berlin (1996).Google Scholar
  2. H. J. Güntherodt, D. Anselmetti, and E. Meyer (editors), Forces in Scanning Probe Methods, Kluwer, Dordrecht (1995).Google Scholar
  3. Roland Wiesendanger (editor), Scanning Probe Microscopy: Analytical Methods, Springer-Verlag, Berlin (1998)Google Scholar
  4. R. Wiesendanger, S. Morita, and E. Meyer (editors), Noncontact Atomic Force Microscopy, Springer-Verlag, Berlin (2002).Google Scholar
  5. Gewirth, R. J. Colton, J. E. Frommer, A. Engel, and H. E. Gaub (editors), Procedures in Scanning Probe Microscopies Wiley and Sons, New York (1998).Google Scholar
  6. V. J. Morris, A. P. Gunning, A. R. Kirby, Atomic Force Microscopy for Biologists, Imperial College Press, London (1999).Google Scholar

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