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Further reading
Introduction
C. Julian Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, Oxford (1993).
Roland Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications, Cambridge University Press, Cambridge (1994).
Intermediate
R. J. Behm, N. Garcia, and H. Rohrer, Scanning Tunneling Microscopy and Related Methods, Kluwer, Dordrecht (1990).
D. A. Bonnell, Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, Wiley and Sons, New York (2000).
Ernst Meyer, Atomic Force Microscopy: Fundamentals to Most Advanced Applications, Springer-Verlag, New York (2002).
In depth
H. J. Güntherodt and R. Wiesendanger (editors), Scanning Tunneling Microscopy, Volumes I–III, 2nd edition. Springer-Verlag, Berlin (1996).
H. J. Güntherodt, D. Anselmetti, and E. Meyer (editors), Forces in Scanning Probe Methods, Kluwer, Dordrecht (1995).
Roland Wiesendanger (editor), Scanning Probe Microscopy: Analytical Methods, Springer-Verlag, Berlin (1998)
R. Wiesendanger, S. Morita, and E. Meyer (editors), Noncontact Atomic Force Microscopy, Springer-Verlag, Berlin (2002).
Gewirth, R. J. Colton, J. E. Frommer, A. Engel, and H. E. Gaub (editors), Procedures in Scanning Probe Microscopies Wiley and Sons, New York (1998).
V. J. Morris, A. P. Gunning, A. R. Kirby, Atomic Force Microscopy for Biologists, Imperial College Press, London (1999).
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(2006). The Physics of Scanning Probe Microscopes. In: Scanning Probe Microscopy. NanoScience and Technology. Springer, New York, NY . https://doi.org/10.1007/0-387-37231-8_1
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