The Physics of Scanning Probe Microscopes

Part of the NanoScience and Technology book series (NANO)


Scanning Tunneling Microscope Theoretical Method Local Probe Scanning Probe Microscope Electron Energy Loss Spectroscopy 
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Further reading


  1. C. Julian Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, Oxford (1993).Google Scholar
  2. Roland Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications, Cambridge University Press, Cambridge (1994).Google Scholar


  1. R. J. Behm, N. Garcia, and H. Rohrer, Scanning Tunneling Microscopy and Related Methods, Kluwer, Dordrecht (1990).Google Scholar
  2. D. A. Bonnell, Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, Wiley and Sons, New York (2000).Google Scholar
  3. Ernst Meyer, Atomic Force Microscopy: Fundamentals to Most Advanced Applications, Springer-Verlag, New York (2002).Google Scholar

In depth

  1. H. J. Güntherodt and R. Wiesendanger (editors), Scanning Tunneling Microscopy, Volumes I–III, 2nd edition. Springer-Verlag, Berlin (1996).Google Scholar
  2. H. J. Güntherodt, D. Anselmetti, and E. Meyer (editors), Forces in Scanning Probe Methods, Kluwer, Dordrecht (1995).Google Scholar
  3. Roland Wiesendanger (editor), Scanning Probe Microscopy: Analytical Methods, Springer-Verlag, Berlin (1998)Google Scholar
  4. R. Wiesendanger, S. Morita, and E. Meyer (editors), Noncontact Atomic Force Microscopy, Springer-Verlag, Berlin (2002).Google Scholar
  5. Gewirth, R. J. Colton, J. E. Frommer, A. Engel, and H. E. Gaub (editors), Procedures in Scanning Probe Microscopies Wiley and Sons, New York (1998).Google Scholar
  6. V. J. Morris, A. P. Gunning, A. R. Kirby, Atomic Force Microscopy for Biologists, Imperial College Press, London (1999).Google Scholar


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