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Embedded Cores and System-on-Chip Testing

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Gizopoulos / Advances in ElectronicTesting

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 27))

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Author information

Authors and Affiliations

  1. SOC Design Techn., Texas Instruments Pvt. Ltd., Bangalore, India

    Rubin Parekhji

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  1. Rubin Parekhji
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Editor information

Editors and Affiliations

  1. University of Piraeus, Greece

    Dimitris Gizopoulos

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© 2006 Springer

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Parekhji, R. (2006). Embedded Cores and System-on-Chip Testing. In: Gizopoulos, D. (eds) Gizopoulos / Advances in ElectronicTesting. Frontiers in Electronic Testing, vol 27. Springer, Boston, MA. https://doi.org/10.1007/0-387-29409-0_7

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  • DOI: https://doi.org/10.1007/0-387-29409-0_7

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-29408-7

  • Online ISBN: 978-0-387-29409-4

  • eBook Packages: EngineeringEngineering (R0)

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