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Segura, J., Hawkins, C., Soden, J. (2006). Failure Mechanisms and Testing in Nanometer Technologies. In: Gizopoulos, D. (eds) Gizopoulos / Advances in ElectronicTesting. Frontiers in Electronic Testing, vol 27. Springer, Boston, MA. https://doi.org/10.1007/0-387-29409-0_2
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