Abstract
This chapter deals with measurement methods for characterizing the parasitic emission and immunity of integrated circuits. We detail most of the standard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse immunity methods are also described, as well as on-chip measurement approaches for noise characterization.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsPreview
Unable to display preview. Download preview PDF.
References
Baudry, D., Bouchelouk, L., Louis, A. and Mazari, B., 2004, Near-field complete characterization of components radiated emissions, Proceedings of EMC Compo 04, Angers, France.
Bolomey, J. C., Gardiol, F. E., 2001, Engineering applications of the modulated scatterer technique, Artech House.
Budka, T. P., Waclawik, S. D., Rebeiz, M., 1996, A coaxial 0.5–18 GHz near electric field measurement system for planar microwave circuits using integrated probes”, IEEE Transactions on Microwave, Technology and Techniques, 44(12): 2174–2184.
Camp, M., Gerth, H., Garbe, H., Haase, H., 2004, Predicting the breakdown behavior of microcontrollers under EMP/UWB impact using a statistical analysis, IEEE Transaction on Electromagnetic Compatibility, 46(3): 368–379.
CISPR 25, 2002, Radio disturbance characteristics for the protection of receivers used on board vehicles, boats, and on devices-Limits and methods of measurement; http://www.cispr.org.
De Leo, R., Rozzi, T., Svara, C., and Zappelli, L., 1991, Rigorous analysis of the GTEM cell, IEEE Transactions on Microwave Theory and Techniques, 39(3): 448–500.
Fiori, F., and Musolino, F., 2004, A New Technique for the Measurement of IC Susceptibility to Electrical Fast Transients, 2004 International Symposium on Electromagnetic Compatibility, Eindhoven, The Netherlands.
Gao, Y., Wolff, I., 1998, Miniature electric near-field probes for measuring 3-D Fields in planar microwave circuits, IEEE Transactions on Microwave, Technology and Techniques, 46(7): 907–913.
Garreau, P., Van’t Kloster, K., and Bolomey, J.C., 1992, Modulated scattering calibration procedure for a 2D array”, proceedings of IEEE AP-S conference, Chicago, pp. 30–45.
Hoad, R., Carter, N. J., Herke, D., Watkins, S. P., 2004, Trends in EM susceptibility of IT equipment, IEEE Transaction on Electromagnetic Compatibility, 46(3): 390–395.
IEC 61967, 2001, Integrated Circuits, measurement of electromagnetic emissions, 150 kHz to 1 GHz, IEC standard; www.iec.ch.
IEC 62132, 2003, Characterization of integrated circuits electromagnetic immunity, IEC standard; www.iec.ch.
Kazama, S., Arai, K. I., 2002, Adjacent Electric Field and Magnetic Field Distribution”, IEEE International Symposium on EMC, Minneapolis, USA, pp. 395–400.
Liang, W., Hygate, G. Nye, J. F., Gentle, D. G. Cook, R. J., 1997, A probe for making near-field measurements with minimal disturbance: the optically modulated scatterer”, IEEE Transaction on Antenna and Propagation, 45(5): 772–780.
Makie-Fukuda, K., Anbo, T., Tsukada, T., Matsura, T., and Hotta, M., 1996, Voltage-comparator-based measurement of equivalently sampled substrate noise waveforms in mixed-signal integrated circuits, IEEE Journal of Solid-State Circuits, 31(5): 726–731.
Marot, C., 2004, EMC IC measurements in design for automotive electronic unit, Proceedings of EMC Europe 2004, Eindhoven.
Marot, C., 2005, EMC measurement relation between IC and system in automotive application, Workshop EMC for ICs, EMC Zurich 2005.
Muccioli, J. P., North, T. M. and Slattery, K. P, 1996, Investigation of the theoretical basis for using a 1 GHz TEM cell to evaluate the radiated emissions from ICs, IEEE International Symposium on Electromagnetic Compatibility, USA.
Slattery, K. P., Neal, J., Cui, W., 1999, Near-field measurements of VLSI devices, IEEE Transaction on Electromagnetic Compatibility, 41(4): 374–384.
Soumyanath, K., Borkar, S., Zhou, C., and Bloechel, B. A., 1999, Accurate on-chip interconnect evaluation: a time-domain technique, IEEE Journal of Solid-State Circuits, 34(5): 623–631.
Vrignon, B., Ben Dhia, S., Lamoureux, E., and Sicard, E. 2005, Characterization and modeling of parasitic emission in deep submicron CMOS”, IEEE transaction on EMC, 47(2): 382–387.
Wang, A.Z.H., 2002, On-Chip ESD protection for Integrated Circuits, An IC Design Perspective, Kluwer Academic Publishers, ISBN 0-7923-7647-1.
Zheng, Y., and Shephard, K. L., 2003, On-chip oscilloscopes for noninvasive time-domain measurement of waveforms in digital integrated circuits, IEEE Transactions on VLSI Systems, 11: 336–344.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer Science+Business Media, Inc.
About this chapter
Cite this chapter
Ben Dhia, S., Ramdani, M., Sicard, E. (2006). Measurement Methods. In: Ben Dhia, S., Ramdani, M., Sicard, E. (eds) Electromagnetic Compatibility of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/0-387-26601-1_4
Download citation
DOI: https://doi.org/10.1007/0-387-26601-1_4
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-26600-8
Online ISBN: 978-0-387-26601-5
eBook Packages: EngineeringEngineering (R0)