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Design for Testability and Built-In Self-Test

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Fault Diagnosis of Analog Integrated Circuits

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 30))

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(2005). Design for Testability and Built-In Self-Test. In: Fault Diagnosis of Analog Integrated Circuits. Frontiers in Electronic Testing, vol 30. Springer, Boston, MA. https://doi.org/10.1007/0-387-25743-8_5

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  • DOI: https://doi.org/10.1007/0-387-25743-8_5

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-387-25742-6

  • Online ISBN: 978-0-387-25743-3

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