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The chapter is based on the papers presented at Design Automation and Test in Europe (DATE), 2001 [158], International Conference on Computer-Aided Design (ICCAD), 2001 [160], Journal on Electronic Testing: Theory and Applicationd (JETTA) 2002 [164, 165].
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© 2005 Springer
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(2005). An Integrated Framework for the Design and Optimization of SOC Test Solutions. In: Introduction to Advanced System-on-Chip Test Design and Optimization. Frontiers in Electronic Testing, vol 29. Springer, Boston, MA. https://doi.org/10.1007/0-387-25624-5_11
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DOI: https://doi.org/10.1007/0-387-25624-5_11
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-3207-3
Online ISBN: 978-0-387-25624-5
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