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Modern Techniques for Characterizing Magnetic Materials pp 267–326Cite as

Magnetic phase imaging with transmission electron microscopy

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References

  1. R.P. Cowburn and M.E. Welland, Science 287 (2000) 1466.

    Article  CAS  Google Scholar 

  2. J.B. Wedding, M. Li, and G.-C. Wang, J. Magn. Magn. Mater. 204 (1999) 79.

    Article  CAS  Google Scholar 

  3. M.J. Freiser, IEEE Trans, MAG-4 (1968) 152.

    Google Scholar 

  4. S.D. Bader, J. Magn. Magn. Mat. 100 (1991) 440.

    Article  CAS  Google Scholar 

  5. J. Stohr et al. Science 259 (1993) 658.

    CAS  Google Scholar 

  6. C.T. Chen et al. Phys. Rev. Lett., 75 (1995) 152.

    Article  CAS  Google Scholar 

  7. M. Schlenker and J. Baruchel, J. Appl. Phys. 49 (1978) 1996.

    Article  CAS  Google Scholar 

  8. G.E. Bacon, Neutron Diffraction, 3rd edition, Clarendon Press, Oxford (1975).

    Google Scholar 

  9. J.J. Saenz et al., J. Appl. Phys. 62 (1987) 4293.

    Article  Google Scholar 

  10. P. Grutter, D. Rugar and H.J. Mamin, Ultramicroscopy 47 (1992) 393.

    Article  Google Scholar 

  11. see for example, “Magnetic imaging and its applications to materials”, Marc De Graef and Y. Zhu eds, Academic Press, (2001).

    Google Scholar 

  12. J.R. Banbury, W.C. Nixon, J. Sci. Instrum. 44 (1967) 889.

    Article  CAS  Google Scholar 

  13. D.C. Joy and J.P. Jakubovics J. Phys. D 2 (1969) 1367.

    Article  Google Scholar 

  14. G.A. Wardly, J. Appl. Phys, 42 (1971) 376.

    Article  Google Scholar 

  15. J. Philibert and R. Tixier, Micron 1 (1969) 174.

    Google Scholar 

  16. D.J. Fathers, J.P. Jakubovics, and D.C. Joy, Phil. Mag. 27 (1973) 765.

    CAS  Google Scholar 

  17. D.J. fathers, J.P. Jakubovics, D.C. Joy, D.E. Newbury and H. Yakowitz, Phys. Status Solidi A_20, (1973) 535; A22 (1974) 609.

    Google Scholar 

  18. K. Koike and K. Hayakawa, Appl. Phys. Lett. 45 (1984) 585.

    Article  CAS  Google Scholar 

  19. J. Unguris, D.T. Pierce, A. Galejs and R.J. Celotta, Phys. Rev. Lett. 49 (1982) 72.

    Article  CAS  Google Scholar 

  20. M R. Scheifein, J. Unguris and M.H. Kelley, P.T. Pierce and R.J. Celotta, Rev. Sci. Instr. 61 (1990) 2501.

    Article  Google Scholar 

  21. E. Bauer and W. Telieps, Emission and low energy reflection electron microscopy” in Surface and interface characterization by electron optical methods, A. Howie and U. Valdre Ed., Plenum, New York, 1988, pp. 195–233.

    Google Scholar 

  22. H. Poppa, E. Bauer and H. Pinkvos, MRS Bull. 20 (1995) 38.

    CAS  Google Scholar 

  23. T. Duden and E. Bauer, Phys. Rev. Lett. 77 (1996) 2308.

    Article  CAS  Google Scholar 

  24. P.B. Hirsch, A. Howie, R.B. Nigholson, D.W. Pashley and M.J. Whelan, Electron Microscopy of Thin Crystals, Lodon, Butterworths, 1965

    Google Scholar 

  25. J.D. Livingston and J.J. Becker, Trans. Amer. Inst. Met. Engrs., 212 (1958) 316.

    CAS  Google Scholar 

  26. J.D. Livingston, Trans. Amer. Inst. Met. Engrs., 215 (1959) 566.

    CAS  Google Scholar 

  27. M.E. Hale, H.W. Fuller and H. Rubinstein, J. Appl. Phys. 30 (1959) 789.

    Article  Google Scholar 

  28. H.W. Fuller and M.E. Hale, J. Appl. Phys. 31 (1960) 238.

    Article  CAS  Google Scholar 

  29. H. Boersch, H. Raith and D. Wohlleben, Z. Phys. 159 (1960) 388.

    Article  CAS  Google Scholar 

  30. J.P. Jakubovics: Lorentz microscopy, in Handbook of Microscopy, Vol. 1, S. Amelinckx et al. Ed., VCH, Weinheim (1997) 505.

    Google Scholar 

  31. J.N. Chapman, P.E. Batson, E.M. Waddell and R.P. Ferrier, Ultramicroscopy 3 (1978) 203.

    Article  CAS  Google Scholar 

  32. E.M. Waddell and J. N. Chapman, Optik 54 (1979) 83.

    Google Scholar 

  33. J. N. Chapman, J. Phys. D: Appl. Phys. 17 (1984) 623.

    Article  CAS  Google Scholar 

  34. N. Chapman, I.R. McFadyen and S. McVitie, IEEE Tram. Magn. 26 (1990) 1506.

    Article  CAS  Google Scholar 

  35. A. Tonomura et al., Phys. Rev. Lett. 44 (1980) 1430.

    Article  CAS  Google Scholar 

  36. A. Tonomura, Rev. Mod. Phys. 59 (1987) 639; J. Magn. Magn. Mat. 31 (1983) 963.

    Article  CAS  Google Scholar 

  37. Introduction to electron holography, E. Volkl, L.F. Allard and D.C. Joy eds, Kluwer Academic/Plenum Publishers, New York 1999.

    Google Scholar 

  38. D. Paganin and K.A. Nugent, Phys. Rev. Lett., 80 (1998) 2586.

    Article  CAS  Google Scholar 

  39. V.V. Volkov, Y. Zhu and M. De Graef, Micron 33 (2002) 411.

    Article  CAS  Google Scholar 

  40. V.V. Volkov and Y. Zhu, Phys. Rev. Lett. 91 (2003) 0439041.

    Article  CAS  Google Scholar 

  41. M.R. Teague, J. Opt. soc. Am. 73 (1983) 1434.

    Article  Google Scholar 

  42. F.A. Lenz, in Electron microscopy in material science 2, Proc. Int. School of El. Micr. Erice (Ed. U. Valdrè, Academic Press, New York, 1971).

    Google Scholar 

  43. M. De Graef, in Magnetic Microscopy and its Applications to Magnetic Materials, M. De Graef and Y. Zhu Eds., chapter 2 (Academic Press, 2001) pp. 27–67.

    Google Scholar 

  44. M. Haider, et al., Electron microscopy image enhanced. Nature, 392 (1998) 768.

    CAS  Google Scholar 

  45. P.E. Batson, N. Dellby and O.L. Krivanek, Nature, 418 (2002) 617.

    Article  CAS  Google Scholar 

  46. C.L. Jia, M. Lentzen, K. Urban, (Science) 299 (2003) 870.

    Article  CAS  Google Scholar 

  47. R. Jagannathan, Phys. Rev. A 42 (1990) 6674.

    Article  Google Scholar 

  48. P.W. Hawks and E. Kasper, Wave Optics, vol. 3 (Ed. Academic Press, 1994).

    Google Scholar 

  49. M.A. Schofield, Y. Zhu, L. Wu, V.V. Volkov and M. Malac, JEOL News: Electron Optics Instrumentation, 36E (2001) 2.

    Google Scholar 

  50. V.V. Volkov, D.C. Crew, Y. Zhu and L.H. Lewis, Rev. Sci. Instruments 73 (2002) 2298.

    Article  CAS  Google Scholar 

  51. J. Chapman, J. Phys. D 17 (1984) 623.

    Article  CAS  Google Scholar 

  52. P.F. Fazzini, P.G. Merli and G. Pozzi, proc. of 15th International Crogress on Electron Microscopy, vol.1, p.327, Durban, South Africa, Sept. 1–6, 2002.

    Google Scholar 

  53. V.V. Volkov, and Y. Zhu, J. Magn. Magn. Mater. 214 (2000) 204.

    Article  CAS  Google Scholar 

  54. A. Hubert and R. Schafer, Magnetic Domains, Springer-Verlag, 1998.

    Google Scholar 

  55. P.G. Merli, G.F. Missiroli and G. Pozzi, Phys. Stat. Sol. 30 (1975) 699.

    Google Scholar 

  56. T. Yoshida, M. Beleggia, J. Endo, K. Harada, H. Kasai, T. Matsuda, G. Pozzi and A. Tonomura. J. Appl. Phys. 85 (1999) 4096.

    Article  CAS  Google Scholar 

  57. M. Beleggia, G. Pozzi, K. Harada, H. Kasai, T. Matsuda, T. Yoshida and A. Tonomura. Microscopy & Microanalysis 3(2) (1997) 509.

    Google Scholar 

  58. J.N. Chapman, A.B. Johnston and L.J. Heydeman, J. Appl. Phys 76 (1994) 5349.

    Article  CAS  Google Scholar 

  59. J.N. Chapman, A.B. Johnston, L.J. Heydeman, S.Mc Vitie, W.A.P. Nicholson and B. Bormans, IEEE Trans. Magn. MAG-30 (1994) 4479.

    Article  Google Scholar 

  60. A.B. Johnston, J.N. Chapman, J. Microsc. 179 (1995) 119.

    Google Scholar 

  61. M. Beleggia, S. Fanesi, R. Patti and G. Pozzi. Materials Characterization 42 (1999) 209.

    Article  CAS  Google Scholar 

  62. J.F. Herbst, Rev. Mod. Phys., 63 (1991) 819.

    Article  CAS  Google Scholar 

  63. E. Burzo, Rep. Pro. Phys., 61 (1998) 1099.

    Article  CAS  Google Scholar 

  64. J. W. Lau, M. A. Schofield, Y. Zhu, and G. F. Neumark, Microscopy & Microanalysis,. 9(2) (2003) 130.

    Google Scholar 

  65. V.V. Volkov, Y. Zhu and M. Malac, Phil. Mag. A, 84 (2004) 2607.

    Article  CAS  Google Scholar 

  66. D. Paganin and K. Nugent, Phys.Rev.Lett. 80 (1998) 2586.

    Article  CAS  Google Scholar 

  67. V.V. Volkov, Y. Zhu and M. De Graef, Micron 33 (2002) 411.

    Article  CAS  Google Scholar 

  68. M. Beleggia, M.A. Schofield, V.V. Volkov and Y. Zhu, D01: 10.1016/j.ultramic.2004.08.004, Ultramicroscopy (2004) in press.

    Google Scholar 

  69. M. Borne and E. Wolf, Principles of optics, 7th ed., Cambridge University Press (1999).

    Google Scholar 

  70. V.V. Volkov, M.A. Schofield and Y Zhu, Mod. Phys. Lett. B 17 (2003) 791.

    Article  CAS  Google Scholar 

  71. Y Zhu, V.V. Volkov and M. DeGraef, J. Electron Microsc. 50 (2001) 447.

    Article  CAS  Google Scholar 

  72. D. Gabor, Nature 161 (1948) 777.

    CAS  Google Scholar 

  73. G. Möllenstedt and H. Düker, Naturwissenschaften 42 (1955) 41.

    Article  Google Scholar 

  74. A. Tonomura, Advances in Physics 41 (1992) 59.

    Article  Google Scholar 

  75. G. Matteucci, G.F. Missiroli and G. Pozzi in Advances in imaging and electron physics 99 (1998) 171 (P.W. Hawkes Ed., Academic Press, 1998).

    Google Scholar 

  76. M.A. Schofield, L. Wu and Y. Zhu, Phys. Rev. B, 67 (2003) 224512.

    Article  CAS  Google Scholar 

  77. Y. Aharonov and D. Bohm, Phys. Rev. 115 (1959) 485.

    Article  Google Scholar 

  78. G.F. Missiroli, G. Pozzi and U. Valdre', J. Phys. E: Sci. Instrum. 14 (1981) 649.

    Article  CAS  Google Scholar 

  79. R. F. Egerton, “Electron Energy-Loss Spectroscopy in the Electron Microscope”, Plenum, New York, 1986.

    Google Scholar 

  80. J. Chapman, Mat. Sci. Eng. B 3 (1989) 355.

    Article  Google Scholar 

  81. M. Beleggia, S. Tandon, Y. Zhu and M. De Graef, Phil. Mag. B 83 (2003) 1143.

    Article  CAS  Google Scholar 

  82. Y Murakami, J.H. Yoo, D. Shindo, T. Atou, and M. Kikuchi, Nature, 423 (2003) 965.

    Article  CAS  Google Scholar 

  83. H. Lichte, private communication

    Google Scholar 

  84. I.S. Gradshtein and I.M. Ryzhik, Table of Integrals, Series and Products, Academic Press, San Diego, 1980.

    Google Scholar 

  85. M. Beleggia, P.F. Fazzini and G. Pozzi, Ultramicroscopy 96 (2003) 96.

    Article  CAS  Google Scholar 

  86. M.A. Schofield and Y. Zhu, Proc. of the 7 th International Symposium on Advanced Physical Fields: Fabrication and characterization of nano-structured materials, Nov.12–15, 2001, Tsukuba, Japan, p41–44.

    Google Scholar 

  87. M.R. Mc Cartney and Y. Zhu, Appl. Phys. Lett. 72 (1998) 1380.

    Article  CAS  Google Scholar 

  88. Y Zhu and M. Mc Cartney, J. Appl. Phys. 84 (1998) 3267.

    Article  CAS  Google Scholar 

  89. M. Beleggia and Y. Zhu. Philos. Mag. B 83 (2003) 1043.

    Google Scholar 

  90. S. Tandon, M. Beleggia, Y. Zhu and M. De Graef, J. Magn. Magn. Mater. 271 (2004) g9.

    Article  CAS  Google Scholar 

  91. W.F. Brown, Jr., Ann. N. Y. Acad. Sci. 147 (1969) 463.

    Google Scholar 

  92. A. Aharoni, J. Appl. Phys. 90 (2001) 4645.

    Article  CAS  Google Scholar 

  93. M. Mansuripur, The Physical Principles of Magneto-optical Recording, Cambridge University Press, 1995.

    Google Scholar 

  94. A.A. Thiele, Bell Syst. Tech. Journal 48 (1969) 3287.

    Google Scholar 

  95. A.A. Thiele, A.H. Bobeck, E. Delia Torre and U.F. Gianola, Bell Syst. Tech. Journal 50 (1971) 711.

    Google Scholar 

  96. A.A. Thiele, Bell Syst. Tech. Journal 50 (1971) 725.

    Google Scholar 

  97. A. Tonomura, Electron Holography (Ed. Springer, Berlin, 1993).

    Google Scholar 

  98. R.E. Dunin-Borkowski, M.R. McCartney, D.J. Smith and S. Parkin, Ultramicroscopy 74 (1998) 61.

    Article  CAS  Google Scholar 

  99. R.E. Dunin-Borkowski, M.R. McCartney, R.B. Frankel, D.A. Bazylinski, M. Posfai and P.R. Buseck, Science 282 (1998) 1868.

    Article  CAS  Google Scholar 

  100. S.L. Tripp, R.E. Dunin-Borkowski and A. Wei, Angew. Chem. Int. Ed. 42 (2003) 5591.

    Article  CAS  Google Scholar 

  101. K.J. Kirk, S. McVitie, J.N. Chapman and C.D.W. Wilkinson, J. Appl. Phys. 89 (2001) 7174.

    Article  CAS  Google Scholar 

  102. J. Komskra, Optik, 80 (1987) 171.

    Google Scholar 

  103. M. Beleggia, Y. Zhu, S. Tandon and M. De Graef. Philos. Mag. B 83 (2003) 1143.

    Article  CAS  Google Scholar 

  104. T. Malis, S.C. Cheng, R.F. Egerton, J. Electron Microsc. Tech. 8 (1988) 193.

    Article  CAS  Google Scholar 

  105. Y. Nakatani, Y. Uesaka, N. Hayashi, Jap. J. Appl. Phys. 28 (1989) 2485.

    Article  CAS  Google Scholar 

  106. M. Beleggia, M.A. Schofield, Y. Zhu, M. Malac, Z. Liu and M. Freeman, Appl. Phys. Lett. 83 (2003) 1435.

    Article  CAS  Google Scholar 

  107. F.R. Chen, unpublished.

    Google Scholar 

  108. K. Yamamoto, I. Kawagiri, T. Tanji, M. Hibino and T. Hirayama, J. Electr. Microsc. 49 (2000) 31.

    CAS  Google Scholar 

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(2005). Magnetic phase imaging with transmission electron microscopy. In: Zhu, Y. (eds) Modern Techniques for Characterizing Magnetic Materials. Springer, Boston, MA. https://doi.org/10.1007/0-387-23395-4_7

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