Abstract
Many companies implement a modular architecture to support the need to create more variants with less effort. Although the modular architecture has many benefits, the tests to detect any defects become a major challenge. However, a modular architecture with defined functional elements seems beneficial to test at module level, so called MPV (Module Property Verification). This paper presents studies from 29 companies with the purpose of showing trends in the occurrence of defects and how these can support the MPV.
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5. References
Baldwin, C., Y., Clark, K., B., (2000), Design Rules-The Power of Modularity, Massachusetts: MIT Press, ISBN 0-262-02466-7
Barkan, P., Hinckley, M., (1994), Benefits and Limitations of Structured Methodologies in Product Design, Management of Design, Engineering, and Management perspectives, USA: Kluwer Academic Publishers, ISBN 0-7923-9509-3
Baudin, M., (2002), Lean Assembly — The Nuts and Bolts of Making Assembly Operations Flow, New York, USA: Productivity Press, ISBN: 1-56327-263-6
Branan, B., (1991), Six Sigma Quality and DFA, DFMA Insight, Vol. 2, Winter 1991
Erixon, G., (1998), Modular Function Deployment-A Method for Product Modularization, Doctoral Thesis, Stockholm: The Royal Institute of Technology, ISSN 1104-2141
Huang, C., C., (1999), Overview of Modular Product Development, Proc. Natl. Sci. Counc., Vol. 24
No. 3
Johnson, R., A., (2000), Probability and Statistics for Engineers, 6th Edition: Prentice-Hall, ISBN 0-13-014158-5
Kenger, P., Onori, M., (2003), Module Property Analysis in the Assembly Process, International Precision Assembly Symposium: Bad Hofgastein, Austria
Kenger, P., Erixon, G., Lennartsson, S., (2003), Module Property Verification-A Conceptual Framework to Perform Product Verifications at Module Level, 14th International Conference on Engineering Design, 19–21 August, Stockholm, Sweden
Nevins, J., L., Whitney, D., E., (1989), Concurrent Design of Products and Processes — A Strategy for the Next Generation in Manufacturing, USA: McGraw-Hill, ISBN 0-07-0463417
O’Connor, P., (2003), Testing for Reliability, Quality and Reliability Engineering International
Onori, M., Barata, J., Lastra, J., M., Tichem, M., (2002), European Precision Assembly Roadmap 2010, Assembly-Net Report to EC, Assembly-Net (GIRT-CT-2001-05039)
Robinson, L., W., McClain, J., O., Thomas, L., J., (1990), the Good, the Bad and the Ugly: Quality on Assembly Line, International Journal of Production Research, Vol. 28 No. 5
Shigeo, S., (1986), Zero Quality Control — Source Inspection and the Poka-yoke System, Portland, USA: Productivity Inc., ISBN 0-915299-07-0
Stake, R. B., (2000), On Conceptual Development of Modular Products — Development of Supporting Tools for the Modularization Process, Doctoral Thesis, Stockholm: The Royal Institute of Technology, ISSN 1650-1888
Stake, R., B., Blackenfelt, M., (1998), Modularity in Use — Experiences from five companies, 4th WDK Workshop on Product Structuring: Delft University of Technology, The Netherlands
Ulrich K, and Tung K, (1991) “Fundamentals of Product Modularity”, DE-Vol. 39, Issues in Design Manufacture/Integration, ASME
Varma, P., (1995), Optimizing Product Profitability — The Test Way, International Test Conference
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© 2005 International Federation for Information Processing
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Kenger, P. (2005). Benefits of Modularity and Module Level Tests. In: Camarinha-Matos, L.M. (eds) Emerging Solutions for Future Manufacturing Systems. BASYS 2004. IFIP International Federation for Information Processing, vol 159. Springer, Boston, MA. https://doi.org/10.1007/0-387-22829-2_40
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DOI: https://doi.org/10.1007/0-387-22829-2_40
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