This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Rights and permissions
Copyright information
© 2004 Springer Science + Business Media, Inc.
About this chapter
Cite this chapter
Rosinger, P.M., Al-Hashimi, B.M., Nicolici, N. (2004). Power Profile Manipulation. In: Power-constrained Testing of VLSI Circuits. Frontiers in Electronic Testing, vol 22B. Springer, Boston, MA. https://doi.org/10.1007/0-306-48731-4_7
Download citation
DOI: https://doi.org/10.1007/0-306-48731-4_7
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4020-7235-2
Online ISBN: 978-0-306-48731-6
eBook Packages: Springer Book Archive