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© 2001 Kluwer Academic Publishers
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(2001). Behavioral Interconnect Diagnosis. In: Boundary-Scan Interconnect Diagnosis. Frontiers in Electronic Testing, vol 18. Springer, Boston, MA. https://doi.org/10.1007/0-306-47975-3_3
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DOI: https://doi.org/10.1007/0-306-47975-3_3
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-7314-8
Online ISBN: 978-0-306-47975-5
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