Analog Measurement Basics

Summary

This chapter has set the stage for discussing the resources provided for analog testing by IEEE 1149.4. It will certainly be the case that today’s In-Circuit test techniques will still be used in the future, even as nail access becomes increasingly limited. IEEE 1149.4 will be a powerful tool for providing measurement access to many physically inaccessible points in a network.

The newly defined node voltage technique will allow us to continue to enjoy test development automation and high-quality diagnostics. The dependence on guarding that has been a mainstay of In-Circuit ATE will, of necessity, give way to the less brutish non-guarded approach. Of course, for the foreseeable future, every technique we know will continue to have value since it is not likely that boards with 100% IEEE 1149.1/1149.4 implementations will become very common.